Abstract
In this research, an atomistic-continuum mechanics (ACM) based on the finite element method (FEM) is applied to investigate the elastic constant of the nanoscale single crystal silicon in different crystallography planes of (100), (110), and (111) under uniaxial tensile loading and modal analysis.
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Lin, CT., Chou, CY., Chiang, K.N. (2007). Validation of Mechanical Properties of Single Crystal Silicon by Atomic-Level Numerical Model. In: Gdoutos, E.E. (eds) Experimental Analysis of Nano and Engineering Materials and Structures. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-6239-1_438
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DOI: https://doi.org/10.1007/978-1-4020-6239-1_438
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-6238-4
Online ISBN: 978-1-4020-6239-1
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