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Fast Atom Bombardment

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Mass Spectrometry

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Abstract

When particles of kiloelectronvolt kinetic energy are impinging on a surface, they cause the ejection of neutrals and secondary ions from that surface. Secondary ion mass spectrometry (SIMS) employing the sputtering effects of a beam of impacting ions on bulk, inorganic materials, [1–3] 252 Cf plasma desorption (PD) time-of-flight (TOF) mass spectrometry effecting desorption/ionization of biomolecules by impact of single megaelectronvolt nuclear fission fragments, [4–6] and molecular beam solid analysis (MBSA) using energetic neutrals [7,8] had already been known when SIMS was applied to organic solids for the first time. [9,10] However, the organic surfaces tended to cause electrostatic charging upon ion impact, thereby disturbing the ion source potentials. Employing a beam of energetic neutral atoms in analogy to the MBSA technique circumvented such problems and gave an impetus to the further development of this promising method. [11,12] The term fast atom bombardment (FAB) was coined [11–13] and prevailed. [7] It turned out that intact molecular or quasimolecular ions could be generated even in case of highly polar compounds that were definitely not candidates for electron ionization (EI, Chaps. 5, 6) or chemical ionization (CI, Chap. 7). Those FAB spectra still suffered from rapid radiolytic decomposition of the samples upon irradiation and from the comparatively harsh conditions of desorption/ionization. The use of a liquid matrix where the analyte was dissolved for analysis brought the awaited improvement.

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    Dr. Jürgen H. Gross

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Gross, J.H. (2004). Fast Atom Bombardment. In: Mass Spectrometry. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-36756-X_9

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