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Smart Materials for Ranging Systems pp 179–194Cite as

INTERFACE AND MAGNETIC CHARACTERIZATION OF FM/AF/FM MULTILAYERS

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Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry ((NAII,volume 226))

Abstract

We use polarized neutron reflectivity to study the evolution of the magnetization profile during the hysteresis of FeCoV (20 nm)/NiO (t NiO ) /FeCoV (20 nm) trilayers. For small t NiO , we find that the magnetization in the two ferromagnetic layers remains parallel, indicating a strong exchange coupling across the anti-ferromagnetic NiO layer. Beyond a film thickness t NiO = 40 nm, the observed step in the hysteresis is seen to correspond to an antiparallel orientation of the two ferromagnetic layers. Since this length scale agrees with the domain wall width of NiO, our results suggest that the interlayer exchange coupling involves a partial domain wall formation in the antiferromagnetic layer.

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Author information

Authors and Affiliations

  1. Physik Department E21, Technische Universität München, James-Franck Strasse, Garching, D-85747, Germany

    V.R. Shah, Christian Schanzer & Peter Böni

  2. Institut Laue-Langevin, 6 rue Jules Horowitz, Grenoble Cedex 9, BP 156-38042, France

    Hans-Benjamin Braun

Authors
  1. V.R. Shah
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  2. Christian Schanzer
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  3. Peter Böni
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  4. Hans-Benjamin Braun
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Editor information

Editors and Affiliations

  1. Van der Waals-Zeeman Instituut, Universiteit van Amsterdam, The Netherlands

    Jaap Franse

  2. Institute for Low Temperature Physics, National Academy of Sciences of Ukraine, Kharkov, Ukraine

    Victor Eremenko

  3. Institute for Low Temperature Physics, National Academy of Sciences of Ukraine, Kharkov, Ukraine

    Valentyna Sirenko

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© 2006 Springer

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Shah, V., Schanzer, C., Böni, P., Braun, HB. (2006). INTERFACE AND MAGNETIC CHARACTERIZATION OF FM/AF/FM MULTILAYERS. In: Franse, J., Eremenko, V., Sirenko, V. (eds) Smart Materials for Ranging Systems. NATO Science Series II: Mathematics, Physics and Chemistry, vol 226. Springer, Dordrecht. https://doi.org/10.1007/1-4020-4646-4_10

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