5. Conclusion
It is possible to determine structures from dynamic electron diffraction data. In most cases low R-values are obtained, which are comparable to those of X-ray single crystal diffraction data. The presence of strong dynamic scattering makes the structure refinement more complex and certainly more time consuming. As such it is a disadvantage. However, it also has a large advantage, because the scattering of a column of atoms depends not only on the scattering potential of the atoms but also on the thickness, resulting in an oscillation in the scattering potential of the column with thickness. Thus for certain thicknesses a column containing only weakly scattering atoms show a higher scattering than a column containing strongly scattering atoms. Consequently by using various thicknesses the weakly scattering atoms can be determined with a higher accuracy. Furthermore it can be used to discriminate between atom types as has been done in the refinement of Ce5Cu19P12, which was started with a model with only Cu atoms on all sites, where by refining the occupancies the locations of the Ce and P atoms were determined.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
J. Jansen, D. Tang, H.W. Zandbergen, H. Schenk, Acta Cryst. A54, 91 (1998).
W.M.J. Coene, A. Thust, M. Op De Beeck, D. Van Dyck, Ultramicroscopy 64, 109 (1996)
J. Jansen, H.W. Zandbergen, M. Otten, Ultramicroscopy 98, 165 (2004).
R.J. Cava, T. Siegrist, S.A. Carter, J.J. Krajewski, W.F. Peck Jr., H.W. Zandbergen, J. Solid State Chem. 121, 51 (1996)
H.W. Zandbergen, S.J. Andersen, J. Jansen, Science 277, 1221 (1997).
S.J. Andersen, H.W. Zandbergen, J. Jansen, C. Træholt, U. Tundal, O. Reiso, Acta Materialia 46, 3283 (1998).
C. Satto, J. Jansen, C. Lexcellent, D. Schryvers, Solid State Comm. 116, 273 (2000).
J. Jansen, H.W. Zandbergen, Ultramicrocopy, 90, 291 (2002).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2006 Springer
About this paper
Cite this paper
Jansen, J. (2006). Structure Refinement by Taking Dynamical Diffraction into Account. In: Weirich, T.E., Lábár, J.L., Zou, X. (eds) Electron Crystallography. NATO Science Series II: Mathematics, Physics and Chemistry, vol 211. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3920-4_22
Download citation
DOI: https://doi.org/10.1007/1-4020-3920-4_22
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-3918-8
Online ISBN: 978-1-4020-3920-1
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)