Abstract
As illustrated in Chapter 2 about solder paste technology, after reflowing the solder paste and cleaning the residue, another major performance area is solder joint integrity during service. With the functions as electrical, thermal, and mechanical linkage, solder joint integrity in a practical environment is apparently vital to the overall function of the assembly.
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References
J. E.Dorn and L. A.Shepard, “What We Need to Know About Creep,”ASTM Spec.Tech. Publ. 165 (1954): 3–30.
R. E. Frenkel, O. D. Sherby, and J. E. Dorn, ACTA Metalurgica 3 (1955): 470.
O. D. Sherby, R.J. Orr, and J. E. Dorn, Trans. A.I.M.E. 200 (1954): 71.
F. A. Mohamed, K. L. Murty, and J. W. Morris, Metallurgical Trans. 4 (1973): 935.
W. Lange, A. Hassnet, and I. Berthold, Phys. Status Solids 1 (1961): 50.
J. E. Breen and J. Weertman, Trans. A. I. M.E. 207 (1955): 1230.
R. W. Evans and B. Wilshire, “Creep of Metals and Alloys,” The Institute of Metals (1985).
C. Herring, J. Appl. Phys. 21 (1950): 437.
N.J. Mott, Proc. Phys. Soc. 64B (1951): 729.
W. R. Cannon and O. D. Sherby, Metallurgical Trans. 1 (1970): 1030.
J. Weertman, Trans. TM-AIME218 (1960): 207.
C. R. Barrett and O. D. Sherby, Trans. TMS-AIME233 (1965): 1116.
Derek Hull, Introduction to Dislocations (Pergamon Press, 1965).
H. J. Grover, S. A. Gordon and L. R. Jackson, “The Fatigue of Metals and Structures,” U.S. Government Printing Office (1954).
Joseph Leibowitz, William Winters, and Jack Kelkin, “Graphite Layers in SMT Boards Control Thermal Mismatch,” Electronic Packaging and Production (Jun. 1985).
L. F. Coffin, “Symposium on Internal Stress and Fatigue of Metals” (Elsevier Publishing Co., 1959).
S. S. Manson, “Behavior of Materials Under Conditions of Thermal Stress,” NASA Tech. Note 2933 (1954).
E. Glenny, J. E. Northwood, S. K. W. Shaw and T. A. Taylor,J. Inst. Metals 85 (1958–59): 294.
E. Glenny and T. A. Taylor,J. Inst. Metals 88 (1960): 449.
W. K. Rey, NASA Tech. Note 4284 (1948).
W. Boas and R. W. K. Honeycombe, Proc. Roy. Soc. A. 186 (1945): 57.
W. Boas and R. W. K. Honeycombe, Proc. Roy. Soc. A. 188 (1946): 28.
O.J. Horger, “Metals Engineering Design,” Am. Soc. Mech. Eng. Handbook (New York: McGraw Hill, 1953).
W. J. Harris, Metallic Fatigue (London: Pergamon Press, 1961).
H. Saburo, 1956 International Conference on Fatigue of Metals, Inst. Mech. Engrs.: 348.
W. H. Liu and H. T. Corten, “Theoretical and Applied Mechanics Dept. Report No. 566,” Univ. of Illinois (Dec. 1958).
L. Ferguson and G. M. Bouton, “The Spirit of Coating of Polybutene on the Fatigue Properties of Lead Alloys,” 1944 Symposium on Stress Corrosion Crack–ing of Metals, Am Soc Test Spec. Tech. Pub. No. 64: 743.
W. Gilde, British Welding Journal (Mar. 1960): 208.
B. P. Haigh and B.Jones,J. Inst. Met. 43 (1930): 271.
Mali Mahalingam, Madhukar Nagarkar, Lynn Loftran, James Andrews, Dennis R. Olsen, and Howard M. Berg, “Thermal Effect of Die Bond Voids,” Semiconductor International (Sept. 1984).
J. K. Hagge, SMT, International Electronics Packaging Society: 547.
P. Heller, SMT:2, International Electronics Packaging Society: 457.
W. Engelmaier, SMT, International Electronics Packaging Society: 539.
W. Engelmaier, “Surface Mount Attachment Reliability of Clip-leaded Ceramic Chip Carriers on FR-4 Circuit Boards,” proceedings, 1987 International Elec–tronics Packaging Soc.: 104.
D. E. Reimer and J. D. Russel, proceedings, 1983 International Hybrid Microelectronics Symposium: 217.
P. M. Hall, Solid State Technology (Mar. 1983).
R. T. Howard, S. W. Sobeck, and C. Sanetia, Solid State Technology (Feb. 1983).
P. A. Chalco, proceedings, 1983 International Hybrid Microelectronics Sympo–sium: 223.
Jennie S. Hwang and N. C. Lee, proceedings, 1985 International Symposium on Microelectronics: 23.
John H. Lau and Donald W. Rice, “Effects of Standoff Height on Solder Joint Fatigue,” SMT:3, International Electronics Packaging Society: 685.
W. M. Sherry, J. S. Erich, M. K. Bartschat, and F. B. Prinz, “Analytical and Experimental Analysis of LCCC Solder Joint Fatigue Life,” proceedings, 1985 Electronic Components Conference: 81. © 1985-IEEE.
D. E. Reimer and C. W. Saulsberry, proceedings, 1984 International Hybrid Microelectronics Symposium: 480.
P. M. Hall, proceedings, 1984 Electronic Components Conference: 107. © 1984-IEEE.
J. M. Smeby, proceedings, 1984 Electronic Components Conference: 117. © 1984-IEEE.
J. R. Taylor and D. J. Pedder, “Joint Strength and Thermal Fatigue in Chip Carrier Assembly,” proceedings, 1982 International Hybrid Microelectronics Symposium: 209.
D. O. Ross, SMT: 2, International Electronics Packaging Soc.: 468.
M. C. Shine, L. R. Fox, J. W. Sofia, SMT: 2, International Electronics Packaging Soc.: 478.
J. Weertman, Trans. of the Metallurgical Soc. of AIME. 218 (1960): 207.
D. W. Hamer and G. R. Sellers, proceedings, 1985 International Hybrid Microelectronics Symposium: 11.
K. N. Tu, Acta Metallurgica, 21 (1973): 347.
P. L. Blum, J. Polissier, and G. Silvestre, Solid State Technology 16 (1973): 55.
T. F. Marinis and R. C. Reinert, proceedings, 1985 Electronic Components Conference: 73. © 1985-IEEE.
Harry N. Keller, “Reliability of External Connections Condensation Soldered to Ti-Pd-Au Thin Film,” proceedings, 1978 International Hybrid Microelectronics Symposium: 297.
R. E. Moore, Connection Technology (May 1985).
G. A. Walker, P. W. DeHaven, and C. C. Goldsmith, proceedings, 1984 International Hybrid Microelectronics Symposium: 125.
A. Adrari and W. L. Green, proceedings, 1983 International Hybrid Microelectronics Symposium: 229.
B. Chalmers, Physical Metallurgy (New York: Wiley, 1959).
C. Wagner, Thermodynamics of Albys (Addison Wesley Publications, 1952).
Charles D. Goodwin, “Real-Time X-Ray Process for Solder Joint Integrity,” proceedings, 1987 National Electronic Packaging and Production Conference, West: 533.
Terry A. Deane and William A. Gruver, “Application of X-Ray Vision for Automating the Solder Quality Inspection of Printed Circuit Boards,” 1987 Smart III Conference, EIA & IPC.
Dr. Alan Traug and Richard Alpen, “Laser/Infrared Technology for Inspecting SMD Solder Joint Quality,” proceedings, 1987 National Electronic Packaging and Production Conference, West: 669.
Dr. Riccardo Vanzetti, “Laser-Infrared Solder Joint Inspection, The Last Step to Full Automation,” The Fifth International Conference of the Israel Society for Quality Assurance, 1984.
Douglas H. Ensign, “Laser Inspection Signature Analysis of Electrical Solder Connections, proceedings, 1987 National Electronic Packaging and Produc”tion Conference, West: 571.
J. P. Streeter, “Laser Inspection of Solder Joints: Recent Results and Defect Detection Capabilities,” proceedings, 1987 National Electronic Packaging and Production Conference, East: 511.
David Trail and David Smith, “Solder Paste Inspection System Focuses on High Production Yields,” Hybrid Circuit Technology (Feb. 1986).
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© 1989 Van Nostrand Reinhold
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Hwang, J.S. (1989). Solder Joint Reliability and Inspection. In: Solder Paste in Electronics Packaging. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-6050-6_9
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DOI: https://doi.org/10.1007/978-94-011-6050-6_9
Publisher Name: Springer, Dordrecht
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