Abstract
Low-cycle fatigue tests of as-cast Sn-Ag eutectic solder (96.5Sn/3.5Ag) were performed using a noncontact strain controlled system at 20°C. The fatigue behavior followed the Coffin-Manson equation with a fatigue-ductility exponent of 0.76. Without local deformation and stress concentration at contact points between the extensometer and the specimen surface in strain-controlled fatigue tests, crack initiation and propagation behavior was observed on the specimen surface using a replication technique. After failure, the longitudinal cross sections were also examined using scanning electron microscopy (SEM). Microcracks initiated from steps at the boundary between the Sn-dendrite and the Sn-Ag eutectic structure and cavities along the boundaries especially around the Ag3Sn particles. Stage II crack propagated in mixed manner with intergranular cracks along the Sn-dendrite boundaries and transgranular cracks through the Sn-dendrites and the Sn-Ag eutectic structure. Propagation of stage II cracks could be expressed by the relation of dac/dN = 4.7 × 10−11[ΔJ]1.5, where ac is the average crack length and ΔJ is the J-integral range. After fatigue tests, small grains were observed in Sn-dendrites near the fracture surface.
Access this article
We’re sorry, something doesn't seem to be working properly.
Please try refreshing the page. If that doesn't work, please contact support so we can address the problem.
Similar content being viewed by others
References
M. Abtew and G. Selvaduray, Mater. Sci. Eng. 27, 95 (2000).
Y. Kariya and M. Otsuka, J. Electron. Mater. 27, 1229 (1998).
H.D. Solomon, J. Electron. Packaging 113, 102 (1991).
J. Liang, N. Gollhardt, P.S. Lee, S.A. Schroeder, and W.L. Morris, Fatigue Fract. Eng. Mater. Struct. 19, 1401 (1996).
R.S. Whitelaw, R.W. Neu, and D.T. Scott, J. Electron. Packaging 121, 99 (1999).
C. Kanchanomai, S. Yamamoto, Y. Miyashita, Y. Mutoh, and A.J. McEvily, Int. J. Fatigue 24, 57 (2002).
ASTM, ASTM E606: Standard Practice for Strain-Controlled Fatigue Testing (Philadelphia, PA: ASTM, 1998), vol. 03.01, p. 525.
E.C. Cutiongco, S. Vaynman, M.E. Fine, and D.A. Jeannotte, J. Electron. Packaging 112, 110 (1990).
J.F. Smith and R.R. Kubalak, in Metals Handbook, ed. W.A. Cubberly (Metals Park, OH: ASM, 1979), p. 613.
L.F. Coffin, Jr., Trans. ASME 76, 931 (1954).
S.S. Manson, Behavior of Materials under Conditions of Thermal Stress, Heat Transfer Symp. (Ann Arbor, MI: University of Michigan Press, 1953), p. 9.
C. Kanchanomai, Y. Miyashita, and Y. Mutoh, Int. J. Fatigue (to be published).
Y. Kariya and M. Otsuka, J. Electron. Mater. 27, 866 (1998).
H.D. Solomon, J. Electron. Packaging 112, 123 (1990).
H.D. Solomon, J. Electron. Packaging 111, 75 (1989).
Z. Mei, J.W. Morris, Jr., M.C. Shine, and T.S.E. Summers, J. Electron. Mater. 20, 599 (1991).
H.D. Solomon, Electronic Packaging-Materials and Processes, ed. J.A. Sartell (Metals Park, OH: ASM, 1985), p. 29.
X.Q. Shi, H.L.J. Pang, W. Zhou, and Z.P. Wang, Int. J. Fatigue, 22, 217 (2000).
F. Gabrielli and V. Lupinc, Proc. ICSMA 5 (Aachen: Pergamon Press, 1979), vol. 1, p. 485.
H.K. Kim and J.C. Earthman, Acta Metall. Mater. 42, 679 (1994).
W.H. Kim and C. Laird, Acta Met. 26, 777 (1978).
W.H. Kim and C. Laird, Acta Met. 26, 789 (1978).
V. Raman and T.C. Reiley, Metall. Trans. A 19A, 1533 (1988).
V. Raman and T.C. Reiley, J. Mater. Sci. Lett. 6, 549 (1987).
A.I. Attarwala, J.K. Tien, G.Y. Masada, and G. Dody, J. Electron. Packaging 114, 109 (1992).
J.K. Tien, B.C. Hentrix, and A.I. Attarwala, NEPCON West’90 Conf. Proc., (1990), vol. II, Cahners Exhibition (Illinois) p. 1353.
H. Jiang, R. Hermann, and W.J. Plumbridge, J. Mater. Sci. 31, 6455 (1996).
Z. Guo, A.F. Sprecher, and H. Conrad, 41st IEEE ECTC Conf. (New York: IEEE, 1991), p. 658.
B.Z. Margolin and V.I. Kostylev, Fatigue Fract. Eng. Mater. Struct. 22, 967 (1999).
N. Miura, T. Shimakawa, Y. Nakayama, and Y. Takahashi, Assessment Methodologies for Preventing Failure: Deterministic and Probabilistic Aspects and Weld Residual Stress (New York: ASME, 2000), vol. I, p. 111.
T. Shimakawa, H. Ogawa, Y. Nakayama, N. Miura and Y. Takahashi, Assessment Methodologies for Preventing Failure: Deterministic and Probabilistic Aspects and Weld Residual Stress (New York: ASME, 2000), vol. I, p. 119.
Stress Intensity Factors Handbook, ed. Y. Murakami, S. Aoki, N. Hasebe, Y. Itoh, H. Miyata, N. Miyzaki, H. Terada, K. Tohgo, M. Toya, R. Yuuki (London: Pergamon Press, 1987).
J. Zhao, Y. Miyashita, and Y. Mutoh, Int. J. Fatigue 23, 723 (2001).
D. Hardwick, C.M. Sellars, and W.J. McG. Tegart, J. Inst. Met. 90, 21 (1961–1962).
D. McLean and M.H. Farmer, J. Inst. Met. 85, 41 (1956–1957).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Kanchanomai, C., Miyashita, Y. & Mutoh, Y. Low-cycle fatigue behavior and mechanisms of a lead-free solder 96.5Sn/3.5Ag. J. Electron. Mater. 31, 142–151 (2002). https://doi.org/10.1007/s11664-002-0161-0
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/s11664-002-0161-0