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Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates

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Abstract

Reversible logic design is a well-known paradigm in digital computation. In this paper, quantum-dot cellular automata (QCA) is investigated for testable implementations of reversible logic in array systems. Testability of 1D arrays consisting of reversible QCA gates is investigated for multiple faulty modules. It has been shown that fault masking is possible in the presence of multiple faults without additional lines for controllability and observability. A technique for achieving C-testability of a 1D array is introduced by adding lines for observability. By adding lines for controllability, as well as observability, the array may be fully tested with a smaller number of test patterns. Different cases of arrays made of QCA reversible gates are presented to illustrate the applicability of the proposed testing method.

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Authors and Affiliations

  1. ECE Department, Northeastern University, Boston, MA, 02115, USA

    Xiaojun Ma, Jing Huang & Fabrizio Lombardi

  2. EE Department, University of Bologna, Bologna, Italy

    Cecilia Metra

Authors
  1. Xiaojun Ma
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  2. Jing Huang
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  3. Cecilia Metra
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  4. Fabrizio Lombardi
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Corresponding author

Correspondence to Xiaojun Ma.

Additional information

Responsible Editors: C. Bolchini and Y.-B. Kim

This manuscript is an extended version of a paper presented at the 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

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Ma, X., Huang, J., Metra, C. et al. Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates. J Electron Test 25, 39–54 (2009). https://doi.org/10.1007/s10836-008-5078-y

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  • DOI: https://doi.org/10.1007/s10836-008-5078-y

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