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Structural, Optical and Electrical Properties of ZnxSn1-xS Thin Films Deposited by Chemical Spray Pyrolysis

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Abstract:

In the present study, ZnxSn1-xS (x = 0, 0.25, 0.5, 0.75 and 1) thin film samples were deposited by ultrasonic spray pyrolysis technique on glass substrates at 350°C to investigate the effect of variation of Zn concentration (x) on the structural, morphological, optical and electrical properties of ZnxSn1-xS thin films. The films were deposited by varying Zn content in the starting solution. The films deposited were found to be amorphous having root mean square (RMS) roughness ranged from 18.2 to 93.5 nm. The optical characterization by UV-Vis spectroscopy showed that the transmittance and reflectance of all samples are lower than 12.2 % and 10 % respectively. The optical band gap was estimated from the reflectance and transmittance spectra are about 3.86 eV. The carrier mobility is ranged from 113 to 2600 cm2/v.s.

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Journal of Nano Research Vol. 61 View Preview

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Periodical:

Journal of Nano Research (Volume 61)

Pages:

72-77

DOI:

https://doi.org/10.4028/www.scientific.net/JNanoR.61.72

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Online since:

February 2020

Authors:

Beddiaf Zaidi*, Naoual Houaidji, Asma Khadraoui, Souheyla Gagui, Chander Shekhar, Yunus Ozen, Kenza Kamli, Zakaria Hadef, Meltem Donmez, Buse Comert, Suleyman Ozcelik, Baghdadi Chouial, B Hadjoudja

Keywords:

Buffer Layer, SnS, Spray Pyolysis, Thin Films, ZnS

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* - Corresponding Author

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