The Nature and Diffusion of Intrinsic Point Defects in SiC
p.471
p.471
Theoretical Investigation of an Intrinsic Defect in SiC
p.477
p.477
Carbon Interstitials in SiC: A Model for the DII Center
p.481
p.481
Chemical Environment of Atomic Vacancies in Electron Irradiated Silicon Carbide Measured by a 2D-Doppler Broadening Technique
p.485
p.485
Radiation-Induced Defects in 4H- and 6H-SiC Epilayers Studied by Positron Annihilation and Deep-Level Transient Spectroscopy
p.489
p.489
Vacancy Defects in As-Polished and in High-Fluence H+-Implanted 6H-SiC Detected by Slow Positron Annihilation Spectroscopy
p.493
p.493
EPR Study of Single Silicon Vacancy-Related Defects in 4H- and 6H-SiC
p.497
p.497
The Neutral Silicon Vacancy in SiC: Ligand Hyperfine Interaction
p.501
p.501
Properties of the UD-1 Deep-Level Center in 4H-SiC
p.505
p.505
Radiation-Induced Defects in 4H- and 6H-SiC Epilayers Studied by Positron Annihilation and Deep-Level Transient Spectroscopy
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 389-393)
Pages:
489-492
Citation:
Online since:
April 2002
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