Research of LED Chips Positioning System

Article Preview

Abstract:

LED chips positioning is a key process in chip quality classification. With the use of pattern-matching mechanism, we proposed a new method for high accuracy positioning system which can be used in detection, sorting and crystal binding machines. Firstly, we used the Otsu and morphological filtering algorithms to gather all kinds of LED chips image. The boundary characteristic points of image were then obtained to bring the feature vector to generate a pattern template. Similar characteristic points were then searched in the sample images to achieve accurate chip positioning. Finally, the Euclidean distance error between the template and target feature vector was compared. As the pattern template is only dependent on the boundaries and independent of the grayscale, the positioning robustness and accuracy can be drastically improved, achieving a positioning error of less than 1 μm and a positioning speed of over 574 grains/second.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 774-776)

Pages:

1512-1517

Citation:

Online since:

September 2013

Authors:

Export:

Price:

[1] WU Xiao-feng, LIU Xue-ping, ZOU Song-qing. The design of vision location system in automatic high-speed die bonder. Machinery Design & Manufacture, 2008, 44( 6) , pp.57-61.

Google Scholar

[2] YU Song, ZHAO Guoqun, WANG Guangchun. Research on Automatic Point-measurement System for LED Grain.XIAN University, 2004, 34( 2), pp.6-9.

Google Scholar

[3] Tang Xiao-yan. Machine Vision Based Defect Inspection System in IC Trim/Form. Software Guide, 2009, 27(4), pp.30-33.

Google Scholar

[4] WU Xiao. LED vision servo two positioning system. China, ZL201220208320. 2 2012. 4.

Google Scholar

[5] Information on http: /www. gkong. com/item/products/2010/11/13/959208. html.

Google Scholar

[6] LI Xue-feng, LI Ling-feng, LIU Fang. Automatic selection of image threshold based on genetic algorithms and Otsu. Information Technology, 2006, (8), pp.52-55.

Google Scholar

[7] SUN Li-ning, MA Li, RONG Wei-bin, GAO Yan . Detecting Rule Based on Shape in LED Chips Testing. Semiconductor Optoelectronics, 2008, 29(5), pp.722-728.

Google Scholar