Comparison between Different Schottky Diode Edge Termination Structures: Simulations and Experimental Results
p.827
p.827
Optimum Design of a SiC Schottky Barrier Diode Considering Reverse Leakage Current due to a Tunneling Process
p.831
p.831
Characterization of the Forward Conduction of 4H-SiC Planar Junction Diode
p.835
p.835
The Electrothermal Behavior of 4H-SiC Schottky Diodes at Forward Bias Considering Single Pulse and Pulsed Current Operation
p.839
p.839
1kV 4H-SiC JBS Rectifiers Fabricated Using an AlN Capped Anneal
p.843
p.843
Simulations of High-Voltage 4H-SiC p+nn+ Diodes Using a Transient Model for the Deep Boron Level
p.847
p.847
Optical Switch-On of Silicon Carbide Thyristor
p.851
p.851
Reverse Current Recovery in 4H-SiC Diodes with n- and p-Base
p.855
p.855
SiC Lateral Super-Junction Diodes Fabricated by Epitaxial Growth
p.859
p.859
1kV 4H-SiC JBS Rectifiers Fabricated Using an AlN Capped Anneal
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 433-436)
Pages:
843-846
Citation:
Online since:
September 2003
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