Annealing Kinetics of Implantation-Induced Amorphous Layer in 6H-SiC (0001)
p.839
p.839
Direct Observation of the Solid-Phase Recrystallization of Self-Implanted Amorphous SiC Layer on (11-20), (1-100), and (0001) Oriented 6H-SiC
p.843
p.843
Ion-Implantation Induced Deep Levels in SiC Studied by Isothermal Capacitance Transient Spectroscopy (ICTS)
p.847
p.847
Distribution Profile of Deep Levels in SiC Observed by Isothermal Capacitance Transient Spectroscopy
p.851
p.851
Enhanced Dopant Diffusion Effects in 4H Silicon Carbide
p.855
p.855
Infrared Investigation of Implantation Damage in 6H-SiC
p.859
p.859
Suppression of Macrostep Formation in 4H-SiC Using a Cap Oxide Layer
p.863
p.863
Masking Process for High-Energy and High-Temperature Ion Implantation
p.867
p.867
Laser Crystallization Mechanism of Amorphous SiC Thin Films
p.871
p.871
Enhanced Dopant Diffusion Effects in 4H Silicon Carbide
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 389-393)
Pages:
855-858
Citation:
Online since:
April 2002
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