The Microstructural Evolutions during Growth of Zn-Fe Electrodeposits on Steel Substrate
p.703
p.703
Fractal Dimension of Zirkonia Grain in Alumina/Zirconia Ceramic Composites
p.709
p.709
EBSP Studies of Growth Rates during Recrystallization
p.713
p.713
Observation of the Growth of Secondary Recrystallization Grains in Grain-Oriented Electrical Steel by New Ultrasonic Wave Method
p.723
p.723
Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films
p.729
p.729
An Experimental Investigation of Grain Boundary Structure Effects on Grain Growth
p.735
p.735
X-Ray Diffraction Measurments of Grain Size as a Function of Orientation in Primary Recrystallized Silicon-Iron
p.743
p.743
In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors
p.749
p.749
Analyzing Method of Surface Structures by X-Ray Photoelectron Spectroscopy (XPS)
p.755
p.755
In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 204-206)
Pages:
749-754
Citation:
Online since:
March 1996
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