Scan Matching by Cross-Correlation and Differential Evolution
Abstract
:1. Introduction
2. Related Work
3. Background
3.1. Experimental Setup and Embedded Data Processing
3.2. Scan Matching
3.3. Iterative Closest Point
- Preprocessing
- Matching
- Rejection
- Cost function evaluation
- Minimization of the cost function (go to step 1. when termination criteria are not met)
3.4. Cross-Correlation
3.5. Differential Evolution
Algorithm 1: A summary of the basic DE. |
4. Scan Matching by Cross-Correlation and Differential Evolution
Algorithm 2: Pseudocode of grid map composition. |
Algorithm 3: Pseudocode of cross-correlation. |
5. Experimental Evaluation
5.1. Simulation Framework and Experimental Data
5.2. Experimental Methodology
6. Results
7. Conclusions
Author Contributions
Funding
Conflicts of Interest
References
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ARM Cortex-M Version | M0+ | M3 | M4 | M7 | |
---|---|---|---|---|---|
Architecture | CPU architecture | Von Neumann | Harvard | Harvard | Harvard |
Pipeline stages | 2 | 3 | 3 | 6 | |
Integer operations | MULT 32 bit | Fast/Slow | Fast | Fast | Fast |
DIV 32 bit | No | Yes | Yes | Yes | |
DSP | No | No | Yes | Yes | |
Floating-point operations | FPU single precision | No | No | Optional | Optional |
FPU double precision | No | No | No | Optional |
Per- | Absolute Translation Error | Relative Translation Error | Absolute Rotation Error | Relative Rotation Error | ||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|
Cen- | (mm) | (%) | () | (%) | ||||||||
tile | ICP | RMSE | CORR | ICP | RMSE | CORR | ICP | RMSE | CORR | ICP | RMSE | CORR |
75 mm | ||||||||||||
25th | 3.5 | 2.7 | 5.4 | 4.6 | 3.6 | 7.0 | 0.18 | 0.02 | 0.08 | 11.0 | 2.1 | 2.8 |
50th | 6.1 | 6.4 | 9.7 | 8.1 | 7.8 | 12.7 | 0.40 | 0.08 | 0.19 | 15.0 | 5.2 | 11.9 |
75th | 11.9 | 15.7 | 22.5 | 15.9 | 20.9 | 30.0 | 0.78 | 0.26 | 0.36 | 49.0 | 14.0 | 38.4 |
150 mm | ||||||||||||
25th | 1.7 | 9.9 | 7.9 | 1.2 | 6.6 | 5.1 | 0.11 | 0.12 | 0.09 | 2.5 | 6.7 | 1.7 |
50th | 3.8 | 22.2 | 11.4 | 2.5 | 13.6 | 7.5 | 0.25 | 0.40 | 0.17 | 4.9 | 12.1 | 5.1 |
75th | 13.8 | 38.4 | 25.4 | 9.2 | 25.6 | 16.9 | 0.64 | 1.27 | 0.36 | 21.6 | 21.0 | 15.8 |
300 mm | ||||||||||||
25th | 3.0 | 36.5 | 5.9 | 0.9 | 12.2 | 2.0 | 0.08 | 0.48 | 0.07 | 0.5 | 11.9 | 1.0 |
50th | 4.7 | 62.6 | 11.3 | 1.6 | 21.0 | 3.8 | 0.25 | 1.14 | 0.17 | 4.1 | 17.9 | 2.4 |
75th | 11.1 | 120.5 | 20.5 | 3.7 | 32.0 | 6.6 | 0.49 | 5.50 | 0.37 | 9.5 | 42.8 | 5.3 |
450 mm | ||||||||||||
25th | 1.2 | 77.1 | 7.8 | 0.3 | 17.2 | 1.7 | 0.03 | 1.03 | 0.10 | 0.2 | 14.1 | 0.9 |
50th | 3.2 | 124.3 | 13.2 | 0.7 | 28.0 | 2.9 | 0.07 | 2.31 | 0.25 | 0.9 | 29.8 | 1.8 |
75th | 10.4 | 376.2 | 31.4 | 2.0 | 83.7 | 7.0 | 0.43 | 9.37 | 0.44 | 3.0 | 95.7 | 6.4 |
750 mm | ||||||||||||
25th | 2.3 | 215.0 | 11.0 | 0.3 | 28.7 | 1.5 | 0.05 | 5.12 | 0.09 | 0.3 | 34.7 | 0.5 |
50th | 3.2 | 704.8 | 16.8 | 0.4 | 91.6 | 2.3 | 0.12 | 13.64 | 0.19 | 0.8 | 55.9 | 1.1 |
75th | 135.9 | 1535.0 | 36.3 | 18.6 | 212.7 | 4.9 | 1.12 | 88.81 | 0.45 | 10.5 | 270.6 | 2.8 |
1500 mm | ||||||||||||
25th | 814.7 | 615.4 | 9.5 | 55.1 | 41.5 | 0.6 | 26.66 | 13.04 | 0.15 | 71.1 | 58.3 | 0.5 |
50th | 1212.9 | 975.1 | 23.5 | 100.8 | 65.1 | 1.7 | 81.03 | 37.67 | 0.53 | 127.1 | 111.5 | 1.7 |
75th | 1709.7 | 1915.8 | 1479.4 | 115.9 | 127.4 | 98.8 | 128.64 | 117.91 | 90.90 | 369.2 | 275.8 | 88.5 |
3000 mm | ||||||||||||
25th | 1382.2 | 1076.6 | 27.7 | 54.4 | 37.5 | 1.4 | 43.72 | 77.87 | 0.93 | 72.9 | 90.5 | 1.1 |
50th | 2084.5 | 1700.7 | 1257.6 | 81.2 | 61.9 | 52.6 | 92.49 | 151.26 | 93.41 | 111.0 | 144.5 | 106.4 |
75th | 2948.9 | 3129.6 | 2466.5 | 106.3 | 121.2 | 91.0 | 163.38 | 167.56 | 167.99 | 229.4 | 518.3 | 365.4 |
Total | ||||||||||||
25th | 2.8 | 30.2 | 8.2 | 1.0 | 14.8 | 1.8 | 0.10 | 0.45 | 0.10 | 1.1 | 9.6 | 1.0 |
50th | 8.9 | 141.5 | 15.6 | 5.1 | 31.0 | 5.3 | 0.49 | 2.57 | 0.25 | 9.6 | 28.4 | 2.8 |
75th | 814.7 | 1076.6 | 51.6 | 69.1 | 91.1 | 18.0 | 26.07 | 51.61 | 1.17 | 85.9 | 113.4 | 19.7 |
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Konecny, J.; Kromer, P.; Prauzek, M.; Musilek, P. Scan Matching by Cross-Correlation and Differential Evolution. Electronics 2019, 8, 856. https://doi.org/10.3390/electronics8080856
Konecny J, Kromer P, Prauzek M, Musilek P. Scan Matching by Cross-Correlation and Differential Evolution. Electronics. 2019; 8(8):856. https://doi.org/10.3390/electronics8080856
Chicago/Turabian StyleKonecny, Jaromir, Pavel Kromer, Michal Prauzek, and Petr Musilek. 2019. "Scan Matching by Cross-Correlation and Differential Evolution" Electronics 8, no. 8: 856. https://doi.org/10.3390/electronics8080856