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Electrochemical Analysis of the Slurry Composition for Chemical Mechanical Polishing of Flexible Stainless-Steel Substrates

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Abstract

The surface quality of the stainless steel affects the efficiency of flexible photovoltaics. Chemical mechanical polishing (CMP) is a finishing process that is used to prepare substrates for electronic devices. The CMP slurry composition is an important factor because additives in the slurry generally improve the polishing performance. However, it is limited to find the optimum conditions for the slurry by only experimental approaches. Thus, this study uses electrochemical analysis and friction monitoring to examine the effects of the abrasive, oxidizer, chelating agent, and pH. Electrochemical and monitoring analysis are useful for validating predictions and understanding interactions between the slurry and the stainless steel surface. Good correspondence was found between the predictions and the polishing results in more accurate. The corrosion rate (CR) obtained from the potentiodynamic polarization curve is proportional to the experimental results, as is the behavior of the curve and the coefficient of friction (COF). After only 3 min CMP, the best performing slurry (abrasive 39 wt %, oxalic acid 1 wt %, H2O2 0.03 wt %, pH 1.5) improved the surface quality of 304 stainless steel by 4 nm. As a result, the proposed methods could help reduce the risks involved in stainless steel CMP slurry and these results could provide a reference for optimizing CMP slurry for flexible 304 stainless steel substrates.

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References

  1. Lee, H., Lee, D., and Jeong, H., Mechanical aspects of the chemical mechanical polishing process: a review, Int. J. Precis. Eng. Manuf., 2016, vol. 17, no. 4, pp. 525–536.

    Article  Google Scholar 

  2. Totolin, V., Göcerler, H., Rodríguez Ripoll, M., and Jech, M., Tribo-electrochemical study of stainless steel surfaces during chemical-mechanical polishing, Lubr. Sci., 2016, vol. 28, no. 6, pp. 363–380.

    Article  Google Scholar 

  3. Lee, S., Chen, Y., Liu, C.P., and Fan, T.J., Electrochemical mechanical polishing of flexible stainless steel substrate for thin-film solar cells, Int. J. Electrochem. Sci., 2013, vol. 8, no. 2, pp. 6878–6888.

    Google Scholar 

  4. Jiang, L., He, Y., Yang, Y., and Luo, J., Chemical mechanical polishing of stainless steel as solar cell substrate, ECS J. Solid State Sci. Technol., 2015, vol. 4, no. 5, pp. 162–170.

    Article  Google Scholar 

  5. Park, B., Lee, H., Kim, Y., Kim, H., and Jeong, H., Effect of process parameters on friction force and material removal in oxide chemical mechanical polishing, Jpn. J. Appl. Phys., 2008, vol. 47, no. 12, pp. 8771–8778.

    Article  ADS  Google Scholar 

  6. Zhang, Z., Liu, W., and Song, Z., Effect of abrasive particle concentration on preliminary chemical mechanical polishing of glass substrate, Microelectron. Eng., 2010, vol. 87, no. 11, pp. 2168–2172.

    Article  Google Scholar 

  7. Lee, D., Lee, H., and Jeong, H., Slurry components in metal chemical mechanical planarization (CMP) process: a review, Int. J. Precis. Eng. Manuf., 2016, vol. 17, no. 12, pp. 1751–1762.

    Article  Google Scholar 

  8. Gorantla, V.R., Goia, D., Matijevic, E., and Babu, S., Role of amine and carboxyl functional groups of complexing agents in slurries for chemical mechanical polishing of copper, J. Electrochem. Soc., 2005, vol. 152, no. 12, pp. 912–916.

    Article  Google Scholar 

  9. Wang, Y. and Zhao, Y., Modeling the effects of oxidizer, complexing agent and inhibitor on material removal for copper chemical mechanical polishing, Appl. Surf. Sci., 2007, vol. 254, no. 5, pp. 1517–1523.

    Article  ADS  Google Scholar 

  10. Jiang, L., He, Y., and Luo, J., Effects of pH and oxidizer on chemical mechanical polishing of AISI 1045 steel, Tribol. Lett., 2014, vol. 56, no. 2, pp. 327–335.

    Article  Google Scholar 

  11. Pohjanne, P., Vepsäläinen, M., Saario, T., Sipilä, K., Romu, J., Saukkonen, T., Hänninen, H., Heikkilä, M., Koskiniemi, J., and Berg, C.-G., Effect of electrochemical potential on stress corrosion cracking susceptibility of EN1.4301 (AISI 304) austenitic stainless steels in simulated hot black liquor, Corrosion, 2015, vol. 71, no. 7, pp. 887–894.

    Article  Google Scholar 

  12. Wijesinghe, T.S.L. and Blackwood, D., Characterization of passive films on 300 series stainless steels, Appl. Surf. Sci., 2006, vol. 253, no. 2, pp. 1006–1009.

    Article  ADS  Google Scholar 

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Correspondence to Haedo Jeong.

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Lee, D., Kim, H., Pak, B. et al. Electrochemical Analysis of the Slurry Composition for Chemical Mechanical Polishing of Flexible Stainless-Steel Substrates. J. Frict. Wear 38, 482–489 (2017). https://doi.org/10.3103/S1068366617060083

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  • DOI: https://doi.org/10.3103/S1068366617060083

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