Abstract—The results of growing polycrystalline (PC) films (FL) of luminophore (LP) based on a solid solution of Cd0.1Zn0.9S: Cu, Аg, sodium salt compounds (Nа2SO4, Na6Cd7S10 = 3Na2S · 7CdS) in an aqueous colloidal solution containing zinc acetate, cadmium nitrate and sodium sulfide compounds on the surface of a new material, a hybrid Si substrate (nano-SiС), under normal physical conditions are presented. The grown PCs were investigated by methods: electron microscopy in the modes of using secondary and reflected electrons, by the method of energy dispersive X-ray spectroscopy (Energy-dispersive X-ray Spectroscope, EDXS). The surface of the substrate was also studied by the Raman method after removing the grown PCs from its surface. a study of morphology showed that PCs are represented by micro-formations: threadlike, needle-shaped and oval in shape and with different crystalline structures. Using the EDXS method, the elemental composition of micro formations was determined. In all forms of pc, Zn, Cd, S and Na are present. It was found that filamentary PCs are represented by the composition Cd0.1Zn0.9S and needle-shaped and oval ones by Cd0.23Zn0.77S. It was shown that the growth form, the location of filamentary PCs on the film surface are determined by the internal structure of the substrate. A mechanism for the formation of filamentary pc composite structure Na2SO4/Si/Cd0.1Zn0.9S by the “solution–solid–solid” growth mechanism is proposed. Raman spectroscopy found that a PC film grown in an aqueous colloidal solution containing LP, sodium compounds on a substrate of a new material improves the luminescent properties of the Si/nano SiC substrate in the infrared region of the spectrum.
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The authors are grateful to S. A. Kukushkin for their constant attention and support, and special thanks to A. V. Redkov for measuring the Raman spectra and their discussion.
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Translated by I.K. Katuev
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Bogdanov, S.P., Sergeeva, N.M. Threaded Polycrystals Na2SO4/Cd0.1Zn0.9S: Cu, Аg on the Surface of the New Material Si/(nano SiС). Mech. Solids 55, 45–54 (2020). https://doi.org/10.3103/S0025654420010070
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DOI: https://doi.org/10.3103/S0025654420010070