2019 Volume 16 Issue 10 Pages 20190176
This paper presents a low-power high-precision sigma-delta analog-to-digital converter (ADC) mainly used for DC measurement, especially in applications with high input impedance. A configurable chopping scheme is proposed to reduce the input-dependent residual offset caused by the clock feed-through. Furthermore, it also improves noise performance in the first integrator. The 1.17 mm2 chip is fabricated in a standard 65 nm CMOS process. Measurement results show that the ADC achieves 20-bit resolution, 10 ppm INL and a 0.6 µV offset, while consuming 860 µW from 3.3 V supply.