IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
A signal degradation reduction method for memristor ratioed logic (MRL) gates
Bosheng LiuYing WangZhiqiang YouYinhe HanXiaowei Li
Author information
JOURNAL FREE ACCESS

2015 Volume 12 Issue 8 Pages 20150062

Details
Abstract

This paper presents a design strategy of eliminating signal degradation for memristor ratioed logic (MRL) gates. Based on the strategy, a novel MRL-based one-bit full adder is proposed. The inverters in circuit can effectively eliminate the degradation and restore signal integrity. To evaluate the effectiveness of the proposed one-bit full adder, an eight-bit full adder is demonstrated as a study case. Compared to the previous MRL-based standard cell design, the proposed circuit can reduce 11.1% memristor cells, 22.2% CMOS transistors, 38.9% vias, 58% power. Compared to the previous MRL-based optimized design, the proposed design can reduce 11.1% memristor cells, 12.5% CMOS transistors, 98.1% power, 98.1% energy.

Content from these authors
© 2015 by The Institute of Electronics, Information and Communication Engineers
Previous article Next article
feedback
Top