Abstract
Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.
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References
G. Binnig, C. F. Quate, and C.H. Gerber, Phys. Rev. Lett. 56, 930–933 (1986).
F.J. Giessibl, Science 267, 68 (1995).
There is a sizeable number of papers on these issues. One of the first was: F.J. Giessibl, Phys. Rev. B 56, 16010 (1997). One of the latest papers is: J.E. Sader and S.P. Jarvis, Phys.Rev. B 70, 012303 (2004).
M. Guggisberg, M. Bammerlin, C.H. Loppacher, O. Pfeiffer, A. Abdurixit, V. Barwich, R. Bennewitz, A. Baratoff, E. Mayer, and H.-J. Güntherodt, Phys. Rev. B 61, 11151 (2000).
P. M. Hoffmann, Appl. Surf. Sci. 210, 140 (2003); P. M. Hoffmann, Small-amplitude atomic force microscopy, in Encyclopedia of Nanotechnology, Dekker (2004).
S. P. Jarvis, H. Yamada, S.-I. Yamamoto, H. Tokumoto, and J. B. Pethica, Nature 384, 247 (1996).
P. M. Hoffmann, A. Oral, R. A. Grimble, H. O. Ozer, S. Jeffery, and J. B. Pethica, Proc. R. Soc. Lond. A 457, 1161 (2001).
D. Rugar, H. J. Mamin, R. Erlandsson, J. E. Stern, and B. D. Terris, Rev. Sci. Instrum. 59, 2337 (1988).
A. Oral, R. A. Grimble, H. Ö. Özer, and J. B. Pethica, Rev. Sci. Instr. 74, 3656 (2003).
R. Pérez, I. Stich, M. C. Payne, and K. Terakura, Phys. Rev. B 58, 10835 (1998).
A. Oral, R. A. Grimble, H. Ö. Özer, P. M. Hoffmann, and J. B. Pethica, Appl. Phys. Lett. 79, 1915 (2001).
P. M. Hoffmann, S. Jeffery, J. B. Pethica, H. Ö. Özer, and A. Oral, Phys. Rev. Lett. 87, 265502 (2001).
J. N. Israelachvili, Intermolecular & Surface Forces, Academic Press, London, 1992.
For example: S. J. O’Shea, M. E. Welland, and T. Rayment, Appl. Phys. Lett. 60, 2356 (1992).
S. Jeffery, P. M. Hoffmann, J. B. Pethica, C. Ramanujan, H. Ö. Özer, and A. Oral, Phys. Rev. B 70, 054114 (2004).
Acknowledgments
The authors acknowledge support by the Research Corporation and the National Science Foundation (NSF-CAREER, NSF-MRI).
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Hoffmann, P.M., Patil, S., Matei, G. et al. Linear measurements of nanomechanical phenomena using small-amplitude AFM. MRS Online Proceedings Library 838, 151–156 (2004). https://doi.org/10.1557/PROC-838-O1.8
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DOI: https://doi.org/10.1557/PROC-838-O1.8