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Structure of layered WSe2 thin films with ultralow thermal conductivity

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Abstract

Crystallographic ordering and defects in WSe2 thin films with ultralow thermal conductivity are characterized by electron imaging and diffraction in cross-sectional geometry. The results show that the film consists of oriented, coherent crystallites that are a few nanometers in diameter. Two films of different thickness with different thermal conductivity are compared. We show that the film with a lower thermal conductivity is characterized by less coherent crystallites with a greater degree of misorientation.

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Acknowledgments

S. Kim was supported by a Korea Research Foundation Grant funded by the Korean Government (MOEHRD, KRF-2006-214-D00072). Electron microscopy was supported by United States Department of Energy Grant DEFG02-01ER45923 and was carried out at the Center for Microanalysis of Materials at the Frederick Seitz Materials Research Laboratory, which is partially supported by the United States Department of Energy under Grant DEFG02-91-ER45439. Material synthesis (D. Johnson) was supported by Office of Naval Research Grants N00014-05-1-0250 and N00014-96-0407.

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Authors and Affiliations

  1. Department of Material Science and Engineering and F. Seitz Materials Research Laboratory, University of Illinois at Urbana–Champaign, Urbana, Illinois, 61801, USA

    Seongwon Kim, Jian Min Zuo & David G. Cahill

  2. Department of Chemistry, University of Oregon, Eugene, Oregon, 97403, USA

    Ngoc T. Nguyen & David C. Johnson

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  1. Seongwon Kim
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  2. Jian Min Zuo
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  3. Ngoc T. Nguyen
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  4. David C. Johnson
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  5. David G. Cahill
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Correspondence to Jian Min Zuo.

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Kim, S., Zuo, J.M., Nguyen, N.T. et al. Structure of layered WSe2 thin films with ultralow thermal conductivity. Journal of Materials Research 23, 1064–1067 (2008). https://doi.org/10.1557/jmr.2008.0124

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  • DOI: https://doi.org/10.1557/jmr.2008.0124

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