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AC Loss Modeling in Ba0.5Sr0.5TiO3 Using Dielectric Relaxation

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Abstract

In universal relaxation, a material’s complex dielectric susceptibility follows a fractional power law f1-n where 0 < n < 1 over multiple decades of frequency. In a variety of materials, including Ba0.5Sr0.5TiO3, dielectric relaxation has been observed to follow this universal relaxation model with values of n close to 1. In this work we have shown that the universal relaxation model can be used to calculate dielectric loss even when n is very close to 1. Our calculated Q-factors agree with measured values at 1 MHz; this agreement suggests that this technique may be used for higher frequencies where network analyzer measurements and electrode parasitics complicate Q-factor determination.

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References

  1. A.K. Jonscher, J. Phys.D: Appl. Phys., 32, R57–R70 (1999).

    Article  CAS  Google Scholar 

  2. J.D. Baniecki, R.B. Laibowitz, T.M. Shaw, P.R. Duncombe, D.A. Neumayer, D.E. Kotecki, H. Shen, and Q.Y. Ma, Appl. Phys. Lett., 72, 498–500 (1998).

    Article  CAS  Google Scholar 

  3. H. Reisinger, G. Steinlesberger, S. Jakshik, M. Gutsche, T. Hecht, M. Leonhard, U. Schroder, H. Seidl, and D. Schumann, IEDM Tech. Digest, 12.2.1–4 (2001).

    Google Scholar 

  4. D.P. Almond, and C.R. Brown, Phys. Rev. Lett. 92, 157601–1 (2004).

    Article  CAS  Google Scholar 

  5. J.R. Jameson, W. Harrison, P.B. Griffin, and J.D. Plummer, Appl. Phys. Lett. 84, 3489 (2004).

    Article  CAS  Google Scholar 

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Acknowledgements

This work was supported by DARPA and DMEA through the Center for Nanoscience Innovation for Defense program (CNID) under award number DMEA90-02-2-0215, and by the ARO through the Multifunctional Adaptive Radio Radar and Sensors program (MARRS MURI) under award number DAAD19-01-1-0496, and by the ONR through the Center for Advanced Nitride Electronics program (CANE MURI) under award number N0014-01-1-0764.

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, 93106, U.S.A.

    Nadia K. Pervez & Robert A. York

  2. Materials Department, University of California, Santa Barbara, CA, 93106, U.S.A.

    Jiwei Lu & Susanne Stemmer

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  1. Nadia K. Pervez
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  2. Jiwei Lu
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  3. Susanne Stemmer
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  4. Robert A. York
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Pervez, N.K., Lu, J., Stemmer, S. et al. AC Loss Modeling in Ba0.5Sr0.5TiO3 Using Dielectric Relaxation. MRS Online Proceedings Library 833, 20–25 (2004). https://doi.org/10.1557/PROC-833-G1.10

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  • DOI: https://doi.org/10.1557/PROC-833-G1.10

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