Abstract
We spatially isolate and detect the luminescence from individual porous Si nanoparticles at room temperature. Our experiments show a variety of phenomena not previously observed in the emission from porous Si including a distribution of emission wavelengths, resolved vibronic structure, random spectral wandering, luminescence intermittency and irreversible photobleaching. Our results indicate that the emission from porous Si nanoparticles originates from excitons in quantum confined Si, strongly influenced by the surface passivating layer of the Si nanocrystal.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).
V. Lehman, U. Gösele, Appl. Phys. Lett. 58, 865 (1991).
R. T. Collins, P. M. Fauchet, M. A. Tischler, Physics Today 50, 24 (1997).
A thorough review of previous spectroscopy experiments and the current understanding of porous Si luminescence can be found in a very recent review article: A. G. Cullis, L. T. Canham, P. D. J. Calcott, J. Appl. Phys. 82, 909 (1997).
S. M. Prokes, J. Appl. Phys. 73, 407 (1993).
M. S. Hybertsen, Phys. Rev. Lett. 72, 1514 (1994).
L. E. Brus, J. Phys. Chem. 98, 3575 (1994).
W. L. Wilson, P. F. Szajowski and L. E. Brus, Science 262, 1242 (1993).
A. L. Efros, M. Rosen, B. Averboukh, D. Kovalev, M. Ben-Chorin and F. Koch, Phys. Rev. B 56, 3875 (1997).
F. Muller, et al., J. Lumin. 57, 283 (1993).
J. C. Vial, et al., IEEE Trans. Nuc. Sci. 39, 563 (1992).
P. Dumas, et al., J. Vac. Sci. Technol. B 12, 2064 (1994).
G. M. Credo, M.D. Mason, S.K. Buratto, submitted.
M. D. Mason, G. M. Credo, K. D. Weston, Phys. Rev. Lett. 80, 5405 (1998).
M. Nirmal et al., Nature 383, 802 (1996).
S. A. Empedocles, D. J. Norris, M. G. Bawendi, Phys. Rev. Lett. 77, 3873 (1996).
R. J. Cook, H. J. Kimble, Phys. Rev. Lett. 54, 1023 (1985).
J. L. Heinrich, C. L. Curtis, G. M. Credo, K. L. Kavanagh, M. J. Sailor, Science 255, 66 (1992).
K. D. Weston, S. K. Buratto, J. Phys. Chem. A 102, 3635 (1998).
The shear force technique described in E. Betzig, P. L. Finn, J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1992) is commonly used as the distance regulation in near-field scanning optical microscopy (NSOM).
D. Sarid, Scanning Force Microscopy: With Applications To Electric, Magnetic, and Atomic Forces (Oxford University Press, New York 1991).
M. J. Sailor, E. J. Lee, Adv. Mater. 9, 783 (1997).
L. E. Brus Phys. Rev. B 53, 4649 (1996).
V. M. Dubin, F. Osanam, J.-N. Chazalviel, Phys. Rev. B 50, 14867 (1994).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Mason, M.D., Credo, G.M., Weston, K.D. et al. Photoluminescence from Single Porous Silicon Chromophores. MRS Online Proceedings Library 536, 27–32 (1998). https://doi.org/10.1557/PROC-536-27
Published:
Issue Date:
DOI: https://doi.org/10.1557/PROC-536-27