Skip to main content
SpringerLink
Log in

Microstructural Characterization of an Oriented Silicalite Film

  • Published:
MRS Online Proceedings Library Aims and scope

Abstract

The crystal orientation of a submicron silicalite membrane is examined using standard x-ray diffraction and pole-figure analyses. Results indicate that the crystals in the molecular sieving layer are preferentially oriented with both straight and sinusoidal channel networks of the zeolite parallel to the membrane surface. This requires that transport across the membrane proceed down the c-axis of the crystals which can occur by jumping between the two channel networks. EDAX data confirms that the molecular sieving layer is the pure silica zeolite silicalite.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. S.I. Zones and M.E. Davis, Solid State Mat. Sci., 1, 107 (1996).

    Article  CAS  Google Scholar 

  2. Y. Yan and T. Bein, J. Phys. Chem., 96, 975 (1992).

    Google Scholar 

  3. G.A. Ozin, A. Kuperman and S. Stein, Angew. Chem. Int. Ed. Engl., 28, 359 (1989).

    Article  Google Scholar 

  4. E.R. Geus, W.J.W. Baker and J.A. Moulin, Microporous Mater., 1, 131 (1993).

    Article  CAS  Google Scholar 

  5. J.G. Tsikoyiannis and W.O. Haag, Zeolites, 12, 126 (1992).

    Article  CAS  Google Scholar 

  6. M.W. Anderson, K.S. Pachis, J. Shi and S.W. Carr, J. Mater, chem., 2, 255 (1992).

    Article  CAS  Google Scholar 

  7. R.D. Noble and J.L. Falconer, Catal. Today, 25, 209 (1995).

    Article  CAS  Google Scholar 

  8. Y. Yan, M. Tsapatsis, M.E. Davis and G.R. Gavalas, J. Chem. Soc. Chem. Commun., 2, 227 (1995).

    Article  Google Scholar 

  9. M.C. Lovallo, M. Tsapatsis and T. Okubo, Chem Mater., 8, 1579 (1996).

    Article  CAS  Google Scholar 

  10. M.C. Lovallo and M. Tsapatsis, AIChE J., 42, 3020 (1996).

    Article  CAS  Google Scholar 

Download references

Acknowledgement

Acknowledgment is made to the donors of the Petroleum Research Fund, administered by the American Chemical Society and the NSF-ARI (CTS-95 12485) Program for support of this research. Also, we acknowledge the W.M. Keck Polymer Morphology Laboratory for use of its Electron Microscopy Facilities.

Author information

Authors and Affiliations

  1. Department of Chemical Engineering, University of Massachusetts Amherst, Amherst, MA, 01003, USA

    M. C. Lovallo & M. Tsapatsis

Authors
  1. M. C. Lovallo
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. M. Tsapatsis
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Lovallo, M.C., Tsapatsis, M. Microstructural Characterization of an Oriented Silicalite Film. MRS Online Proceedings Library 454, 161–166 (1996). https://doi.org/10.1557/PROC-454-161

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1557/PROC-454-161

Search

Navigation