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Evolution of Interfacial Roughness Correlations of Fe Au Films Grown on Mgo(001) Substrates

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Abstract

The growth by sputtering of a series of thin films of Fe/Au on MgO(001) substrates was analyzed using Bragg and diffuse X-ray scattering. The Fe (bcc) layer grows rotated by 45° with respect to the MgO - Au(fcc) (001) epitaxial orientation, resulting in an almost perfect match between the two metallic structures. By collecting the X-ray diffuse scattering under grazing incidence using a 2-dimensional image plate detector, we mapped the reciprocal space of these films. We characterized the correlated interface roughness starting with a buffer of Fe in which only three interfaces are present. The propagation of the roughness was subsequently characterized for Fe/Au multilayers with 40 and 100 bilayers. We observe an enlargement of the surface features as a function of time, evidenced by the longer lateral cutoff length measured for thicker films.

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Authors and Affiliations

  1. Department of Physics, University of Houston, Houston, TX, 77204-5506, USA

    P. C. Chow, R. Paniago, R. Forrest & S. C. Moss

  2. IBM Almaden Research Center, 650 Harry Road, San Jose, CA, 95120-6099, USA

    S. S. P. Parkin

  3. ANSTO, Private Mail Bag 1, Menai, 2234, Australia

    D. Cookson

Authors
  1. P. C. Chow
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  2. R. Paniago
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  3. R. Forrest
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  4. S. C. Moss
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  5. S. S. P. Parkin
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  6. D. Cookson
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Chow, P.C., Paniago, R., Forrest, R. et al. Evolution of Interfacial Roughness Correlations of Fe Au Films Grown on Mgo(001) Substrates. MRS Online Proceedings Library 440, 359–364 (1996). https://doi.org/10.1557/PROC-440-359

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  • DOI: https://doi.org/10.1557/PROC-440-359

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