Abstract
Multilayers of vanadium and MgO with different layer thicknesses were grown by molecular beam epitaxy (MBE) and the V/MgO and MgO/V interfaces were investigated by cross-sectional high resolution electron microscopy (HREM). For the smallest layer thickness of 5 nm, the vanadium and MgO films were coherent with each other and no misfit dislocations were observed. For the larger layer thicknesses of 10 nm and 50 nm, the vanadium surface exhibited undulations, and for the largest thickness, interdiffusion had occurred between the MgO film and the underlying V substrate and an interfacial spinel phase had formed. These observations are discussed in terms of the morphological instabilities of the strained vanadium film as it grows on the MgO substrate.
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Pirouz, P., Ikuhara, Y. & Flynn, C.P. Metallic thin Films on Ceramic Substrates: Stress-Enhanced Intermixing and Spinel Formation. MRS Online Proceedings Library 356, 247–258 (1994). https://doi.org/10.1557/PROC-356-247
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DOI: https://doi.org/10.1557/PROC-356-247