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Growth and Characterization of Epitaxial PbTiO3Thin Films On Mgo

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Epitaxial PbTiO3 thin films have been grown on single-crystal MgO (100) substrates using metalorganic chemical vapor deposition technique. The energy gap was determined from optical absorption data to be Eg= 3,425 eV. Secondary ion mass spectrometry data showed uniform distribution of Pb, Ti and O atoms with no traces of carbon contamination. Atomic force microscopy studies showed different surface morphology for different film growth rates. In-situ X-ray diffraction data indicate that the tetragonal-to-cubic structural phase transition occurs at about 500-520°C. Above 750 °C the films exhibit multi-phase character, the textured PbTiO3 phase co-existing with a polycrystalline Pb2Ti2O6 structure and a possible Mg-containing impurity phase.

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Zhang, K., Pashmakov, B., Mogilevsky, R. et al. Growth and Characterization of Epitaxial PbTiO3Thin Films On Mgo. MRS Online Proceedings Library 341, 355–360 (1994). https://doi.org/10.1557/PROC-341-355

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