Abstract
The strength of planar interfaces between a substrate and a thin coating (1-2 µm) can be measured quite effectively by a laser spallation technique. In this technique a laser pulse of a high energy and a predetermined length is converted into a pressure pulse of a critical amplitude and width that is sent through the substrate toward the free surface with the coating. The compressive pressure pulse is reflected into a tension pulse from the free surface of the coating and loads the coating/substrate interface in tension. The laser flux is tuned to a threshold level at which the interface comes apart. The critical stress amplitude that accomplishes the removal of the coating is determined from a computer simulation process. The simulation itself is verified by means of a piezoelectric crystal probe which is capable of mapping out the profile of the stress pulse generated by the laser pulse.
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Acknowledgements
This research has been supported initially by IST/SDIO through the ONR under Contract No. N00014-85-K-0645 and more recently by ONR under Grant No. N00014-89-J-1609. For this support and his continued keen interest in this research we are grateful to Dr. S. Fishman of that agency. We are also to the M.I.T George Harrison Spectroscopy Laboratory for the use of their facilities and finally to Mr. B. Chambers for providing the SiC coatings.
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Gupta, V., Argon, A.S. Measurement Of Interface Strength By Laser Pulse Induced Spallation. MRS Online Proceedings Library 188, 245–250 (1990). https://doi.org/10.1557/PROC-188-245
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DOI: https://doi.org/10.1557/PROC-188-245