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Critical Current Density, Flux Creep, and Microstructure in A Bi-Sr-Ca-Cu-O System

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Abstract

We measured magnetization hysteresis and zero-field-cooled magnetic relaxation for liquid-quenched Bi-Sr-Ca-Cu-O samples at various temperatures. We found that there is a close correlation between the magnetic behavior and the microstructures of the samples. The magnetization hysteresis greatly increases in the samples with a large amount of crystal defects such as precipitates and stacking faults in the matrix of the material. We also found that the flux creep is reduced as a result of these microstructural changes.

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Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W-31-109-ENG-38.

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Shi, D., Boley, M.S., Chen, J.G. et al. Critical Current Density, Flux Creep, and Microstructure in A Bi-Sr-Ca-Cu-O System. MRS Online Proceedings Library 169, 959–962 (1989). https://doi.org/10.1557/PROC-169-959

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  • DOI: https://doi.org/10.1557/PROC-169-959

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