Skip to main content
SpringerLink
Log in

In-Situ Study of Radiation Damage in V2os Induced by Low Energy Electrons

  • Published:
MRS Online Proceedings Library Aims and scope

Abstract

Radiation damage in V2Os induced by electrons in the energy range 0-3 keV has been studied by high resolution electron microscopy, X-ray photoelectron spectroscopy and mass spectrometry. Different phase transformations were observed when V205 was irradiated by electrons of different energies. The damage kinetics and the role of electron radiation enhanced diffusion were investigated. It was found that nucleation and growth of lower oxides was driven by electron radiation enhanced diffusion.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. M.L. Knotek and Peter J. Feibelman, Surf. Sci. 90, 78 (1979); Phys. Rev. Lett. 40, 964, (1978); Phys. Rev. B 18, 6531, (1978).

    Article  CAS  Google Scholar 

  2. L. Fiermans and J. Vennik, Surf. Sci. 9, 187, (1968); 18, 317, (1969); 24, 541 (1971).

    Article  Google Scholar 

  3. H.G. Tompkins, I.M. Curelaru, K.S. Din and E. Suonine, Appl. Surf. Sci. 21, 280 (1985).

    Article  CAS  Google Scholar 

  4. H.-J. Fan and L.D. Marks, Ultramicroscopy, accepted.

  5. J.C. Tully in Desorption Induced by Electronic Excitation DIET I, edited by N.H Tolk, M.M. Traum, J.C. Tully and T.E. Madey (Springer-Verlag, New York, 1983), pp 31–38.

  6. M.N Colparet, P. Clauws, L. Fiermans and J. Vennik, Surf. Sci. 36, 513 (1973).

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Materials Science and Engineering, Northwestern University, Evanston, IL, 60208, USA

    R. Ai, H.-J. Fan, P. C. Stair & L. D. Marks

Authors
  1. R. Ai
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. H.-J. Fan
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. P. C. Stair
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. L. D. Marks
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Ai, R., Fan, HJ., Stair, P.C. et al. In-Situ Study of Radiation Damage in V2os Induced by Low Energy Electrons. MRS Online Proceedings Library 157, 599–604 (1989). https://doi.org/10.1557/PROC-157-599

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1557/PROC-157-599

Search

Navigation