Abstract
Hydrogenated amorphous silicon films for photovoltaics and thin film transistors are deposited from silane containing discharges. The radicals generated in the plasma such as SiH3 and H impinge on the surface and lead to silicon film growth through a complex network of elementary surface processes that include adsorption, abstraction, insertion and diffusion of various radicals. Mechanism and kinetics of these reactions determine the film composition and quality. Developing deposition strategies for improving the film quality requires a fundamental understanding of the radical-surface interaction mechanisms. We have been using in situ multiple total internal reflection Fourier transform infrared spectroscopy and in situ spectroscopic ellipsometry in conjunction with atomistic simulations to determine the elementary surface reaction and diffusion mechanisms. Synergistic use of experiments and atomistic simulations elucidate elementary processes occurring on the surface. Herein, we review our current understanding of the reaction mechanisms that lead to a-Si:H film growth with special emphasis on the reactions of the SiH3 radical.
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A. Shah, P. Torres, R. Tscharner, N. Wyrsch, and H. Keppner, Science 285, 692 (1999).
J. R. Abelson, Appl. Phys. A 56, 493 (1993).
G. Ganguly and A. Matsuda, Phys. Rev. B 47, 3661 (1993).
R. Robertson, D. Hils, H. Chatham, and A. Gallagher, Appl. Phys. Lett. 43, 544 (1983).
R. Robertson and A. Gallagher, J. Appl. Phys. 59, 3402 (1986).
H. Fujiwara, Y. Toyoshima, M. Kondo, and A. Matsuda, Phys. Rev. B 60, 13598 (1999).
H. Fujiwara, Y. Toyoshima, M. Kondo, and A. Matsuda, Solar Energy Materials and Solar Cells 66, 209 (2001).
W. M. M. Kessels, A. H. M. Smets, D. C. Marra, E. S. Aydil, D. C. Schram, and M. C. M. van de Sanden, Thin Solid Films 383, 154 (2001).
W. M. M. Kessels, D. C. Marra, M. C. M. van de Sanden, and E. S. Aydil, J. Vac. Sci. Technol. A 20, 781 (2002).
D. C. Marra, E. A. Edelberg, R. L. Naone, and E. S. Aydil, J. Vac. Sci. Technol. A 16, 3199 (1998).
D. C. Marra, E. A. Edelberg, R. L. Naone, and E. S. Aydil, Appl. Surf. Sci. 133, 148 (1998).
D. C. Marra, W. M. M. Kessels, M. C. M. van de Sanden, K. Kashefizadeh, and E. S. Aydil, Surf. Sci. 530, 1 (2003).
Y. Toyoshima, K. Arai, A. Matsuda, and K. Tanaka, Appl. Phys. Lett. 57, 1028 (1990).
Y. Toyoshima, K. Arai, A. Matsuda, and K. Tanaka, Appl. Phys. Lett. 56, 1540 (1990).
Y. Toyoshima, K. Arai, A. Matsuda, and K. Tanaka, J. Non-Cryst. Solids 137, 765 (1991).
Y. Toyoshima, A. Matsuda, and K. Arai, J. Non-Cryst. Solids 166, 103 (1993).
M. Katiyar, G. F. Feng, Y. H. Yang, N. Maley, and J. R. Abelson, J. Non-Cryst. Solids 166, 111 (1993).
M. Katiyar, G. F. Feng, Y. H. Yang, J. R. Abelson, and N. Maley, Appl. Phys. Lett. 63, 461 (1993).
M. Katiyar, Y. H. Yang, and J. R. Abelson, J. Appl. Phys. 77, 6247 (1995).
A. von Keudell and J. R. Abelson, Appl. Phys. Lett. 71, 3832 (1997).
A. von Keudell and J. R. Abelson, J. Appl. Phys. 84, 489 (1998).
A. von Keudell and J. R. Abelson, Phys. Rev. B 59, 5791 (1999).
I. M. P. Aarts, B. Hoex, A. H. M. Smets, R. Engeln, W. M. M. Kessels, and M. C. M. van de Sanden, Appl. Phys. Lett. 84, 3079 (2004).
W. M. M. Kessels, J. P. M. Hoefnagels, P. J. van den Oever, Y. Barrell, and M. C. M. van de Sanden, Surf. Sci. 547, L865 (2003).
S. Agarwal, A. Takano, M. C. M. van de Sanden, D. Maroudas, and E. S. Aydil, J. Chem. Phys. 117, 10805 (2002).
S. Agarwal, S. Sriraman, A. Takano, M. C. M. van de Sanden, E. S. Aydil, and D. Maroudas, Surf. Sci. 515, L469 (2002).
D. Maroudas, Adv. Chem. Eng. 28, 251 (2001).
S. Ramalingam, D. Maroudas, E. S. Aydil, and S. P. Walch, Surf. Sci. 418, L8 (1998).
S. Ramalingam, D. Maroudas, and E. S. Aydil, J. Appl. Phys. 84, 3895 (1998).
S. Ramalingam, D. Maroudas, and E. S. Aydil, Appl. Phys. Lett. 72, 578 (1998).
S. Ramalingam, D. Maroudas, and E. S. Aydil, J. Appl. Phys. 86, 2872 (1999).
S. Ramalingam, P. Mahalingam, E. S. Aydil, and D. Maroudas, J. Appl. Phys. 86, 5497 (1999).
S. Ramalingam, D. Maroudas, and E. S. Aydil, IEEE Trans. on Plasma Sci. 27, 104 (1999).
S. Ramalingam, E. S. Aydil, and D. Maroudas, J. Vac. Sci. Technol. B 19, 634 (2001).
S. Ramalingam, S. Sriraman, E. S. Aydil, and D. Maroudas, Appl. Phys. Lett. 78, 2685 (2001).
S. Sriraman, S. Ramalingam, E. S. Aydil, and D. Maroudas, Surf. Sci. 459, L475 (2000).
S. Sriraman, E. S. Aydil, and D. Maroudas, J. Appl. Phys. 92, 842 (2002).
S. Sriraman, S. Agarwal, E. S. Aydil, and D. Maroudas, Nature 418, 62 (2002).
S. Sriraman, E. S. Aydil, and D. Maroudas, IEEE Trans. on Plasma Sci. 30, 112 (2002).
S. Sriraman, P. Mahalingam, E. S. Aydil, and D. Maroudas, Surf. Sci. 540, L623 (2003).
S. Sriraman, E. S. Aydil, and D. Maroudas, J. Appl. Phys. 95, 1792 (2004).
S. P. Walch, S. Ramalingam, E. S. Aydil, and D. Maroudas, Chem. Phys. Lett. 329, 304 (2000).
S. P. Walch, S. Ramalingam, S. Sriraman, E. S. Aydil, and D. Maroudas, Chem. Phys. Lett. 344, 249 (2001).
E. S. Aydil, D. Maroudas, D. C. Marra, W. M.M. Kessels, S. Agarwal, S. Ramalingam, S. Sriraman, M. C. M. Van de Sanden, and A. Takano, Mat. Res. Soc. Symp. Proc. 664, A.1.1.1 (2001).
J. Tersoff, Phys. Rev. Lett. 56, 632 (1986).
J. Tersoff, Phys. Rev. B 37, 6991 (1988).
J. Tersoff, Phys. Rev. B 39, 5566 (1989).
T. Ohira, T. Inamura, and T. Adachi, Mater. Res. Soc. Symp. Proc. 336, 177 (1994).
T. Ohira, O. Ukai, T. Adachi, Y. Takeuchi, and M. Murata, Phys. Rev. B 52, 8283 (1995).
T. Ohira, O. Ukai, M. Noda, Y. Takeuchi, and M. Murata, Mater. Res. Soc. Symp. Proc. 408, 445 (1996).
M. S. Valipa, E. S. Aydil, and D. Maroudas, Surf. Sci. Lett., submitted (2004).
T. Bakos, M. S. Valipa, E. S. Aydil, and D. Maroudas, unpublished, (2004).
S. Agarwal, B. Hoex, M. C. M. van de Sanden, D. Maroudas, and E. S. Aydil, Surf. Sci. Lett., submitted, (2004).
D. A. Doughty, J. R. Doyle, G. H. Lin, and A. Gallagher, J. Appl. Phys. 67, 6220 (1990).
M. S. Valipa, S. Sriraman, E. S. Aydil, and D. Maroudas, Surf. Sci., submitted (2004).
Acknowledgments
This work was supported by the NSF/DoE Partnership for Basic Plasma Science and Engineering (Award Nos. ECS-0317345 and ECS-0317459), an NSF/ITR grant (Award No. CTS-0205584), and Camille Dreyfus Teacher-Scholar Awards to two of the authors (E.S.A. and D.M.). Fruitful discussions with M.A. Amat, T. Bakos, and M.R. Gungor also are gratefully acknowledged.
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Aydil, E.S., Agarwal, S., Valipa, M. et al. Surface Processes during Growth of Hydrogenated Amorphous Silicon. MRS Online Proceedings Library 808, 311–319 (2003). https://doi.org/10.1557/PROC-808-A5.5
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DOI: https://doi.org/10.1557/PROC-808-A5.5