Abstract
In-situ transmission electron microscopy (TEM) method is powerful in a way that it can directly correlate the atomic-scale structure with physical and chemical properties. We will report on the construction and applications of the homemade in-situ TEM electrical and optical holders. Electrical transport of carbon nanotubes and photoconducting response on bending of individual ZnO nanowires have been studied inside TEM. Oxygen vacancy electromigration and its induced resistance switching effect have been probed in CeO2 films.
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Bai, X., Xu, Z., Gao, P. et al. Electrical, Optical and Ionic Probe inside Transmission Electron Microscope. MRS Online Proceedings Library 1525, 1102 (2013). https://doi.org/10.1557/opl.2013.190
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DOI: https://doi.org/10.1557/opl.2013.190