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Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive

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Abstract

The microstructure of Ba(Cd1/3Ta2/3)O3 ceramics with boron additive was investigated by high-resolution and analytical electron microscopy. Superlattice reflections were present at positions of (h ± 1/3, k ± 1/3, l ± 1/3) away from the fundamental reflections in the [110] zone diffraction pattern for the pseudocubic perovskite unit cell. Lattice images showed a well-ordered structure with hexagonal symmetry. No boron segregation and amorphous phase was observed along grain boundaries. An amorphous phase rich in boron-oxide was observed to form pockets partially penetrating along multiple grain junctions.

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Authors and Affiliations

  1. Center for Solid State Science, and Department of Physics and Astronomy, Arizona State University, 85287, Tempe, Arizona, USA

    J. Sun & David J. Smith

  2. School of Materials Science and Engineering, Shanghai Jiao-tong University, 20003, Shanghai, People’s Republic of China

    J. Sun

  3. Department of Chemical and Materials Engineering, Science and Engineering Materials Program, Arizona State University, 85287, Tempe, Arizona, USA

    Shaojun Liu & N. Newman

  4. Center for Solid State Science, Arizona State University, 85287, Tempe, Arizona, USA

    M. R. McCartney

Authors
  1. J. Sun
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  2. Shaojun Liu
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  3. N. Newman
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  4. M. R. McCartney
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  5. David J. Smith
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Sun, J., Liu, S., Newman, N. et al. Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive. Journal of Materials Research 19, 1387–1391 (2004). https://doi.org/10.1557/JMR.2004.0185

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  • DOI: https://doi.org/10.1557/JMR.2004.0185

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