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Ellipse fitting for interferometry. Part 2: experimental realization

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Abstract

Extracting phase and amplitude information from the quadrature signals of an optical interferometer is an essential first step in any measurement. Where these signals are displayed as a Lissajous figure, the primary limitation to accuracy is determined by the goodness-of-fit to the ellipse, which is especially problematic for ellipses with high ellipticity. In a companion paper by Collett and Tee [J. Opt. Soc. Am. A 31, 2573 (2014) [CrossRef]  ], we described a novel, linear ellipse fitting method that outperforms all previously published algorithms. Here, we demonstrate the experimental application of this algorithm to several measurement problems of practical interest.

© 2014 Optical Society of America

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