Hostname: page-component-848d4c4894-nr4z6 Total loading time: 0 Render date: 2024-05-01T01:22:00.704Z Has data issue: false hasContentIssue false
  • English
  • Français

Energy Dispersive Diffraction in a Diamond Anvil High Pressure Cell Using Synchrotron and Conventional X-Radiation

Published online by Cambridge University Press:  06 March 2019

David R. Black ,
Carmen S. Menoni  and
Ian L. Spain
David R. Black
Affiliation:
Department of Physics, Colorado State University, Fort Collins, Colorado 80523
Carmen S. Menoni
Affiliation:
Department of Physics, Colorado State University, Fort Collins, Colorado 80523
Ian L. Spain
Affiliation:
Department of Physics, Colorado State University, Fort Collins, Colorado 80523
Get access

Extract

A wide range of structural studies have been carried out in high pressure diamond anvil cells using x-rays. The most common experimental geometry is shown in Fig. 1a. The incident x-ray beam passes axially through the first diamond and enters the sample, typically 100-300 μm in diameter and 20-100 μm thick; the diffracted x-rays exit via the second diamond. Energy-dispersive detection techniques (EDXRD) have been used. However the intensity of diffracted radiation from the sample is weak, so that typical exposure times with a conventional, fixed anode, x-ray source are typically one to several days.Accordingly, higher intensity radiation from synchrotron sources has been used for these experiments.

Type
III. Position Sensitive Detectors and X-Ray Instrumentation
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 331 - 337
Copyright
Copyright © International Centre for Diffraction Data 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Skelton, E. F., Liu, C. Y., and Spain, I. L., “Simple Improvements to a D.A.H.P. Cell for X-Ray Diffraction Studies,“ High Temp.-High Press. 9:19–26 (1977).Google Scholar
2. Spain, I. L., Qadri, S. B., Menoni, C. S., Webb, A. W., Skelton, E. F., “Structural Studies at High Pressure and Temperature Using Synchrotron Radiation,” pp. 73–80, in:“Physics of Solids Under Pressure,” Schilling, J. S. and Shelton, R. N., eds., North Holland Publ. Co., Amsterdam (1981).Google Scholar
3. Ruoff, A. L. and Baublitz, M. A., “Physics of Solids Under Pressure,” pp. 81–90, Schilling, J. S. and Shelton, R. N., eds., North Holland Publ, Co., Amsterdam (1981).Google Scholar
4. Baublitz, M. A., Arnold, V., and Ruoff, A. L., “Energy Dispersive X-Ray Diffraction from High Pressure Polycrystalline Specimens Using Synchrotron Radiation,” Rev. Sci. Inst. 52:16161624 (1981).Google Scholar
5. Skelton, E. F., Qadri, S. B., Webb, A. W., Lee, C. W., and Kirkland, J. P., “Improved System for Energy-Dispersive X-Ray Diffraction with Synchrotron Radiation,” Rev. Sci. Instr. 54:403–2 (1983).Google Scholar
6. Buras, B., Staun Olsen, J., Gerward, L., Will, G. and Hinze, E., “X-Ray Energy-Dispersive Diffractometry Using Synchrotron Radiation,” J. Appl. Cryst. 10:431–2 (1977).Google Scholar
7. Brown, D. B., Gilfrich, J. V., and Peckerar, M. C., “Measurement and Calculation of Absolute Intensities of X-Ray Spectra,“ J. Appl. Phys. 46:4537–20 (1975).Google Scholar
8. Winick, H. and Doniach, S., “Properties of Synchrotron Radiation, Plenum Press, New York (1979).Google Scholar
9. McMaster, W. H., N. Kerr Del Grande, Mallett, J. H., and Hubbell, J. H., “Compilation of X-Ray Cross Sections,” National Bureau of Standards, UCRL-50.74, Sec. II, Rev. 1.Google Scholar
10. CRC Handbook of Chemistry and Physics, 63rd edition, (1982).Google Scholar
11. Gebhart, B., “Heat Transfer,” McGraw-Hill, Hightstown, NJ (1961)Google Scholar