Hostname: page-component-848d4c4894-4hhp2 Total loading time: 0 Render date: 2024-05-01T05:29:04.864Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Microprobe Studies of Hungarian Background and Urban Aerosols

Published online by Cambridge University Press:  06 March 2019

Sz. Török ,
Sz. Sándor ,
C. Xhoffer ,
R. Van Grieken ,
K.W. Jones ,
S.R. Sutton  and
R.L. Rivers
Sz. Török
Affiliation:
Central Research Institute for Physics H-1525 Budapest, P.O.Box 49
Sz. Sándor
Affiliation:
Central Research Institute for Physics H-1525 Budapest, P.O.Box 49
C. Xhoffer
Affiliation:
Department of Chemistry, University of Antwerp (UIA) B-2610 Antwerp-WIlrijk, Belgium
R. Van Grieken
Affiliation:
Department of Chemistry, University of Antwerp (UIA) B-2610 Antwerp-WIlrijk, Belgium
K.W. Jones
Affiliation:
Brookhaven National Laboratory Upton, NY 11973 USA
S.R. Sutton
Affiliation:
The University of Chicago Chicago, II 60637 USA
R.L. Rivers
Affiliation:
The University of Chicago Chicago, II 60637 USA
Get access

Extract

In order to determine the polluting atmospheric sources in urban and background areas source apportionment of the air particulate matter is necessary. Hitherto these studies were mostly based on bulk composition measurements of the aerosol. Source profiles, i.e. the concentrations of several elements for air particulate matter originating from one source, can be deduced from the receptor data using a number of multivariate techniques among which the chemical mass balance. The application is limited by the large number of observations that must be made for each of the variables. Often an elaborated sample preparation is necessary for fractionating the sample into several sub samples, according to the density, particle diameter or other relevant properties . Often this may results in poorly resolved source profiles.

Type
XIV. XRS Applications
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 1183 - 1188
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Bernard, P., Van Grieken, R., Eisma, D., Environ. Sci,Technol. 20, 457 (1986)Google Scholar
2. Artaxo, P.,Manhaut, W. and Van Grieken, R., Tellus, in press. Torok Sz, Sandor, S. and Rausch,H., Advances in X-Ray Analysis, 33, 673, Plenum Press, New York, 1990. Google Scholar
3. Torok, Sz., Sandor, Sz., Xhoffer, C., Van Grieken, R., KFKI-1992-16-J Report, Central Research Institute for Physics, Budapest.Google Scholar
4. Van Espen, P., Anal. Chim. Acta, 165, 31 (1984).Google Scholar
5. Forgy, E. W., Biometrics 21, 768 (1965).Google Scholar
6. Jones, K.W., Bookman, R.S., Gordon, B. M.,Rivers, M. L., Saubermann, A. J., Schildlovsky, G., and Spanne, P., in XRF and PIXE Applications if Life Science, Capri, Italy, eds. R.Moro and R. Ceareo (World Scientific Publishing Co., Singapore, 1990, p. 163).Google Scholar
7. Torok, S., Sandor, Sz., Xhoffer, C., Van Grieken, R., Molnar, A., Meszaros, E. , Jarai-Komlodi, M. Submitted to Meteorology.Google Scholar
8. Xhoffer, C., Brenard, P., Van Grieken, R. and Van dex Auwera, L., Envir. Technol. 25,1470 (1991).Google Scholar
9. Bassette, M. and Seinfeld, J. H., Atmos. Environ. 17,2237 (1984).Google Scholar