High-Speed Optical Microscanner Driven with Resonation of Lam Waves Using Pb(Zr,Ti)O3 Thick Films Formed by Aerosol Deposition

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Published 22 September 2005 Copyright (c) 2005 The Japan Society of Applied Physics
, , Citation Jun Akedo et al 2005 Jpn. J. Appl. Phys. 44 7072 DOI 10.1143/JJAP.44.7072

1347-4065/44/9S/7072

Abstract

A high-performance optical microscanner with a resonance frequency over 20 kHz and a scan angle (peak-to-peak value) over 30° in atmospheric ambient, was successfully fabricated by deposit piezoelectric materials at a high rate by the AD method onto a metal scanner structure, which was fabricated by mechanical machining. The scanner is applicable to SVGA high-resolution display of 800×600 or more. This method is a powerful tool for realizing ceramic integration with metal components.

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10.1143/JJAP.44.7072