Abstract
Cerium oxide thin films are deposited on quartz substrate using pulsed laser deposition technique at a substrate temperature 973 K with an oxygen partial pressure of 0.2 Pa. The properties of the grown films mainly depend on the quality of the deposition. In the present investigation the deposition is carried out using excimer laser (KrF). To improve the microstructure and crystallite properties the deposited thin films are annealed at 1073 K for 2 h. The prepared and annealed thin films characterized by X-ray diffraction, atomic force microscope (AFM) and UV-visible spectroscopy: X-ray diffraction analysis confirmed the polycrystalline nature of the thin films. Crystallite size, lattice constant and texture coefficient are calculated. The film thickness is measured using XP-1 stylus profiler, optical band gap has been carried out and surface roughness has been estimated from AFM.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Zivkrovic, L.S., Lair, V., Lupan, O., and Cassir, M., Samarium-doped ceria nanostructured thin films grown on FTO glass by electrodepostion, Acta Phys. Pol., A, 2011, vol. 120, pp. 298–302.
Wang, Y., Mori, T., Ji-gung, L.I., and Ikegami, T., Low-temperature synthesis of praseodymium-doped ceria nano powders, J. Am. Ceram. Soc., 2002, vol. 85, no. 12, pp. 3105–3107.
Taniguchi, I., Van Landschoot, R.C., and Schoonman, J., Electrostatic spray deposition of Gd0.1Ce0.9O1.95 and La0.9Sr0.1Ga0.8Mg0.2O2.87 thin films, Solid State Ionics, 2003, vol. 160, pp. 271–279.
Nilgün Özer, Optical properties and electrochromic characterization of sol–gel deposited ceria films, Sol. Energy Mater. Sol. Cells, 2001, vol. 68, nos. 3–4, pp. 391–400.
Al-Robaee, M.S., Rao, K.N., and Mohan, S., Influence of substrate temperature on the properties of oxygen-ion-assisted deposited CeO2 films, J. Appl. Phys., 1992, vol. 71, pp. 2380–2386.
Ghanashyam Krishna M., Hartridge, A., and Bhattacharya, A.K., Temperature and ionic size dependence of the properties of ceriabasedoptionic thin films, Mater. Sci. Eng., B, 1998, vol. 55, nos. 1–2, pp. 14–20.
Strømme, M.M., Azens, A., Niklasson, G.A., Granqvist, C.G., and Purans, J., Li intercalation in transparent Ti–Ce oxide films: Energetics and ion dynamics, J. Appl. Phys., 1997, vol. 81, no. 9, pp. 6432–6437.
Hong, Y.S., Kim, S.H., Kim, W.J., and Yoon, H.H., Fabrication and characterization GDC electrolyte thin films by E-beam technique for IT-SOFC, Curr. Appl Phys., 2011, vol. 11, pp. S163–S168.
Graboy, I.E., Markov, N.V., Maleev, V.V., Kaul, A.R., Polyakov, S.N., Svetchnikov, V.L., Zandbergen, H.W., and Dahmen, K.H., An improvement of surface smoothness and lattice match of CeO2 buffer layers on R-sapphire processed by MOCVD, J. Alloys Compd., 1997, vol. 251, nos. 1–2, pp. 318–321.
Päiväsaari, J., Putkonena, M., and Niinistö, L., Cerium dioxide buffer layers at low temperature by atomic layer deposition, J. Mater. Chem., 2002, vol. 12, no. 6, pp. 1828–1832.
Elidrissi, B., Addou, M., Regragui, M., Monty, C., Bougrine, A., and Kachouane, A., Structural and optical properties of CeO2 thin films prepared by spray pyrolysis, Thin Solid Films, 2000, vol. 379, pp. 23–27.
Muthukkumaran, K., Kuppusami, P., Mathews, T., Mohandas, E., and Selladurai, S., Atomic force microscopy investigations of gadolinia-doped ceria thin films prepared by pulsed laser deposition technique, Mater. Sci. Poland, 2007, vol. 25, no. 3, pp. 671–678.
Chaudhuri, T., Phok, S., and Bhattacharya, R., Pulsed-laser deposition of textured cerium oxide thin films on glass substrates at room temperature, Thin Solid Films, 2007, vol. 515, no. 17, pp. 6971–6974.
Venkatesan, T. and Green, S.M., Pulsed laser deposition: Thin films in a flash, Ind. Phys., 1996, pp. 22–24.
Yu, M., Lin, J., Fu, J., Zhang, H., and Han, Y.C., Sol–gel synthesis and photoluminescent properties of LaPO4: A (A = Eu3+, Ce3+, Tb3+) nanocrystalline thin films, J. Mater. Chem., 2003, vol. 13, no. 6, pp. 1413–1419.
Joseph, B., Manoj, P.K., and Vaidyan, V.K., Studies on preparation and characterization of indium doped zinc oxide films by chemical spray deposition, Bull. Mater. Sci., 2005, vol. 28, no. 5, pp. 487–493.
Ong, H.C., Zhu, A.X.E., and Du, G.T., In situ observation of nickel metal-induced lateral crystallization of amorphous silicon thin films, Appl. Phys. Lett., 2002, vol. 80, pp. 941–943.
Sandipan Ray, Gupta, P.S., Gurdeep Singh, Electrical and optical properties of sol–gel prepared Pd-doped SnO2 thin films: Effect of multiple layers and its use as room temperature methane gas sensor, J. Ovonic Res., 2010, vol. 6, no. 1, pp. 23–34.
Suzuki, T., Kosacki, I., Petrovsky, V., and Anderson, H.U., Optical properties of undoped and Gd-doped CeO2 nanocrystalline thin films, J. Appl. Phys., 2002, vol. 91, no. 4, pp. 2308–2314.
Author information
Authors and Affiliations
Corresponding author
Additional information
The article is published in the original.
Rights and permissions
About this article
Cite this article
Nagaraju, P., Vijayakumar, Y. & Ramana Reddy, M.V. Optical and microstructural studies on laser ablated nanocrystalline CeO2 thin films. Glass Phys Chem 41, 484–488 (2015). https://doi.org/10.1134/S1087659615050107
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1087659615050107