Abstract
The compensation effect has been revealed in undoped polycrystalline CdTe synthesized during rapid crystallization. The revealed effect leads to an increase in the electrical resistivity to 108–1010 Ω cm at a background impurity concentration of ∼1015 cm−3 (GaCd and ClTe donors, unidentified acceptors). For some samples, this effect is accompanied by the appearance of persistent photoconductivity, which disappears at a temperature of ∼200 K. It has been shown that all the polycrystals studied are characterized by a three-level compensation mechanism in which the fundamental properties of the material are determined by deep donors and/or acceptors with a concentration of 1012 cm−3. Depending on the specific growth conditions, the electrical resistivity at room temperature is determined by deep centers with activation energies of 0.59 ± 0.10 and 0.71 ± 0.10 eV, which are supposedly related to intrinsic point defects, and deep centers with activation energies of 0.4 ± 0.1 eV, which belong to the DX center formed by the GaCd donor.
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Original Russian Text © V.S. Bagaev, Yu.V. Klevkov, S.A. Kolosov, V.S. Krivobok, A.A. Shepel’, 2011, published in Fizika Tverdogo Tela, 2011, Vol. 53, No. 8, pp. 1479–1487.
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Bagaev, V.S., Klevkov, Y.V., Kolosov, S.A. et al. Compensation effect in undoped polycrystalline CdTe synthesized under nonequilibrium conditions. Phys. Solid State 53, 1554 (2011). https://doi.org/10.1134/S1063783411080051
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DOI: https://doi.org/10.1134/S1063783411080051