Abstract
The possibility to fabricate scanning tunneling microscopy (STM) probes with controlled electronic structure using single crystalline tungsten tips is discussed. High resolution power of oriented single crystalline probes is demonstrated in atomic and subatomic resolution STM studies of silicon, gallium telluride and graphite surfaces. The possibility of controllable selection of the tungsten tip atom electron orbitals responsible for the surface imaging in STM experiments is demonstrated.
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Original Russian Text © A.N. Chaika, S.S. Nazin, V.N. Semenov, V.G. Glebovskiy, S.I. Bozhko, O. Lübben, S.A. Krasnikov, K. Radican, I.V. Shvets, 2011, published in Metally, 2011, No. 4, pp. 3–10.
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Chaika, A.N., Nazin, S.S., Semenov, V.N. et al. Application of single crystalline tungsten for fabrication of high resolution STM probes with controlled structure. Russ. Metall. 2011, 603–609 (2011). https://doi.org/10.1134/S0036029511070044
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DOI: https://doi.org/10.1134/S0036029511070044