Abstract
A small-sized generator of picosecond electron beams is used to measure the temporal resolution of EUV and soft X-ray silicon detectors produced by the Ioffe Physical Technical Institute, Russian Academy of Sciences. The temporal resolution of the EUV and soft X-ray detectors based on silicon photodiodes is shown to be ∼1 ns. Preliminary experiments have been performed using these detectors with the aim of investigating the radiation characteristics of a soft X-ray source based on an X-pinch driven by a small-sized highcurrent generator with a current pulse amplitude of 250 kA. This source is used at the Institute of High Current Electronics for soft X-ray backlighting diagnostics of various plasmas.
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Original Russian Text © A.P. Artyomov, E.H. Baksht, V.F. Tarasenko, A.V. Fedunin, S.A. Chaikovsky, P.N. Aruev, V.V. Zabrodskii, M.V. Petrenko, N.A. Sobolev, V.L. Suhanov, 2015, published in Pribory i Tekhnika Eksperimenta, 2015, No. 1, pp. 104–108.
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Artyomov, A.P., Baksht, E.H., Tarasenko, V.F. et al. Temporal response of silicon EUV and soft X-ray detectors. Instrum Exp Tech 58, 102–106 (2015). https://doi.org/10.1134/S0020441215010017
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DOI: https://doi.org/10.1134/S0020441215010017