Skip to main content
Log in

Temporal response of silicon EUV and soft X-ray detectors

  • General Experimental Techniques
  • Published:
Instruments and Experimental Techniques Aims and scope Submit manuscript

Abstract

A small-sized generator of picosecond electron beams is used to measure the temporal resolution of EUV and soft X-ray silicon detectors produced by the Ioffe Physical Technical Institute, Russian Academy of Sciences. The temporal resolution of the EUV and soft X-ray detectors based on silicon photodiodes is shown to be ∼1 ns. Preliminary experiments have been performed using these detectors with the aim of investigating the radiation characteristics of a soft X-ray source based on an X-pinch driven by a small-sized highcurrent generator with a current pulse amplitude of 250 kA. This source is used at the Institute of High Current Electronics for soft X-ray backlighting diagnostics of various plasmas.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. Seisyan, R., Tech. Phys., 2005, vol. 50, no. 5, p. 535.

    Article  Google Scholar 

  2. Anchutkin, V., Bel’skii, A., and Gushchin, O., Fotonika, 2010, no. 1, p. 10.

    Google Scholar 

  3. Stamm, U., RIKEN Review, 2003, vol. 50, p. 63.

    Google Scholar 

  4. Aleksandrov, V.V., Volkov, G.S., Grabovski, E.V., Gribov, A.N., Gritsuk, A.N., Laukhin, Ya.N., Mitrofanov, K.N., Oleinik, G.M., Sasorov, P.V., and Frolov, I.N., Plasma Phys. Rep., 2012, vol. 38, no. 4, p. 315.

    Article  ADS  Google Scholar 

  5. Artyomov, A.P., Fedyunin, A.V., Chaikovsky, S.A., Zhigalin, A.S., Oreshkin, V.I., Ratakhin, N.A., and Rousskikh, A.G., Instrum. Exper. Tech., 2013, vol. 56, no. 1, p. 66, DOI: 10.7868/S0032816213010023.

    Article  Google Scholar 

  6. Bogomaz, A.A., Budin, A.V., Zabrodskii, V.V., Kuznetsova, I.V., Losev, S.Yu., Petrenko, M.V., Pinchuk, M.E., and Rutberg, Ph.G., Instrum. Exper. Tech., 2008, vol. 51, no. 5, p. 744.

    Article  Google Scholar 

  7. Aruev, P.N., Kolokolnikov, Yu.M., Kovalenko, N.V., Legkodymov, A.A., Lyakh, V.V., Nikolenko, A.D., Pindyurin, V.F., Sukhanov, V.L., and Zabrodsky, V.V., Nuclear Instr. Meth. Phys. Res. A, 2009, vol. 603, p. 58, DOI: 1-.1016/j.nima.2008.12.159.

    Article  ADS  Google Scholar 

  8. Razeghi, M. and Rogalski, A., J. Appl. Phys., 1996, vol. 79, p. 7433, DOI: 10.1063/1.362677.

    Article  ADS  Google Scholar 

  9. Scholze, F., Klein, R., and Müller, R., Metrologia, 2006, vol. 43, p. 6, DOI: 10.1088/00261394/43/2/S02. http://iopscience.iop.org/0026-1394/43/2/S02.

    Article  ADS  Google Scholar 

  10. Kostyrya, I.D., Tarasenko, V.F., and Shitts, D.V., Prib. Tekh. Eksp., 2008, No. 4, p. 159.

    Google Scholar 

  11. Yalandin, M.I., Reutova, A.G., Sharypov, K.A., Shpak, V.G., Shunailov, S.A., and Mesyats, G.A., Tech. Phys. Lett., 2010, vol. 36, no. 18, p. 830.

    Article  ADS  Google Scholar 

  12. Al’bikov, Z.A., Veretennikov, A.I., and Kozlov, O.V., Detektory impul’snogo ioniziruyushchego izlucheniya (Detectors of Pulse Ionizing Radiation), Moscow: Atomizdat, 1978.

    Google Scholar 

  13. Zakharov, S.M., Ivanenkov, G.V., Kolomenskii, A.A., Pikuz, S.A., Samokhin, A.I., and Ulshmid, I., Pis’ma Zh. Tekh. Fiz., 1982, vol. 8, p. 1060.

    Google Scholar 

  14. Pikuz, S.A., Shelkovenko, T.A., Romanova, V.M., Sinars, D.B., Hammer, D.A., Bland, S.N., and Lebedev, S.V., Nukleonika, 2001, vol. 46, p. 21.

    Google Scholar 

  15. Rousskikh, A.G., Oreshkin, V.I., Chaikovsky, S.A., Labetskaya, N.A., Shishlov, A.V., Beilis, I.I., and Baksht, R.B., Physics of Plasmas, 2008, vol. 15, no. 10, p. 102706, DOI: 10.1063/1.3000390.

    Article  ADS  Google Scholar 

  16. Shelkovenko, T.A., Pikuz, S.A., Douglass, J.D., McBride, R.D., Greenly, J.B., and Hammer, D.A., IEEE Trans. Plas. Sci., 2006, vol. 34, no. 5, p. 2336, DOI: 10.1109/TPS.2006.878362.

    Article  ADS  Google Scholar 

  17. Ratakhin, N.A., Fedushchak, V.F., Erfort, A.A., Zharova, N.V., Zhidkova, N.A., Chaikovskii, S.A., and Oreshkin, V.I., Russ. Phys. J., 2007, vol. 50, no. 2, p. 193.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to A. P. Artyomov.

Additional information

Original Russian Text © A.P. Artyomov, E.H. Baksht, V.F. Tarasenko, A.V. Fedunin, S.A. Chaikovsky, P.N. Aruev, V.V. Zabrodskii, M.V. Petrenko, N.A. Sobolev, V.L. Suhanov, 2015, published in Pribory i Tekhnika Eksperimenta, 2015, No. 1, pp. 104–108.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Artyomov, A.P., Baksht, E.H., Tarasenko, V.F. et al. Temporal response of silicon EUV and soft X-ray detectors. Instrum Exp Tech 58, 102–106 (2015). https://doi.org/10.1134/S0020441215010017

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S0020441215010017

Keywords

Navigation