Uniformity of charge collection efficiency in Frisch collar spectrometer with THM grown CdZnTe crystals

Alireza Kargar; Adam C. Brooks; Mark J. Harrison; Henry Chen; Salah Awadalla; Glenn Bindley; Bob Redden; Douglas S. McGregor

doi:10.1117/12.826422

11 September 2009 Uniformity of charge collection efficiency in Frisch collar spectrometer with THM grown CdZnTe crystals

Alireza Kargar, Adam C. Brooks, Mark J. Harrison, Henry Chen, Salah Awadalla, Glenn Bindley, Bob Redden, Douglas S. McGregor

Author Affiliations +

Proceedings Volume 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI; 744908 (2009) https://doi.org/10.1117/12.826422
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

A 4.7×4.7×9.5 mm³ Frisch collar device was fabricated from CdZnTe materials grown by the Traveling Heater Method (THM). The device was then characterized through probing with a highly collimated 662 keV gammaray source of ¹³⁷Cs. In a systematic series of experiments, the detector, at its best design, was probed using a collimated ¹³⁷Cs source. The results were confirmed through simulating the charge collection efficiency (CCE) maps of the device under the operated condition. It is proved that, unlike the planar configuration, the charge collection efficiency profile along the length of Frisch collar device is considerably improved. It is also shown that enhancement in spectral performance occurs due to the application of the Frisch collar to a planar device. This enhancement is due to the fact that the Frisch collar alters the nonuniform CCE profile in a planar device to a more uniform distribution in a Frisch collar device. Additionally, a technique to optimize this uniform distribution is investigated for a 5.0 × 4.7 × 19.6 mm³ Frisch collar device, while the experimental results are confirmed though numerical simulation. Based on this technique, there exists an optimum dielectric layer thickness for the CdZnTe Frisch collar device, for which the CCE profile has its best (most uniform) distribution and shows its best spectroscopic performance. The CdZnTe materials for this study were grown by THM at Redlen Technologies and the CdZnTe devices were fabricated and characterized at the S.M.A.R.T. Laboratory at Kansas State University.

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Alireza Kargar, Adam C. Brooks, Mark J. Harrison, Henry Chen, Salah Awadalla, Glenn Bindley, Bob Redden, and Douglas S. McGregor "Uniformity of charge collection efficiency in Frisch collar spectrometer with THM grown CdZnTe crystals", Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 744908 (11 September 2009); https://doi.org/10.1117/12.826422

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