Paper
4 February 2009 Model-based steganalysis using invariant features
Author Affiliations +
Proceedings Volume 7254, Media Forensics and Security; 72540B (2009) https://doi.org/10.1117/12.810507
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States
Abstract
One of the biggest challenges in universal steganalysis is the identification of reliable features that can be used to detect stego images. In this paper, we present a steganalysis method using features calculated from a measure that is invariant for cover images and is altered for stego images. We derive this measure, which is the ratio of any two Fourier coefficients of the distribution of the DCT coefficients, by modeling the distribution of the DCT coefficients as a Laplacian. We evaluate our steganalysis detector against three different pixel-domain steganography techniques.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tu-Thach Quach, Fernando Pérez-González, and Gregory L. Heileman "Model-based steganalysis using invariant features", Proc. SPIE 7254, Media Forensics and Security, 72540B (4 February 2009); https://doi.org/10.1117/12.810507
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Cited by 5 scholarly publications.
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KEYWORDS
Steganalysis

Steganography

Sensors

Statistical analysis

Detection and tracking algorithms

Error analysis

Fourier transforms

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