Paper
29 January 2007 TOF laser scanner characterization for low-range applications
Gabriele Guidi, Carlo Bianchini
Author Affiliations +
Proceedings Volume 6491, Videometrics IX; 649109 (2007) https://doi.org/10.1117/12.705288
Event: Electronic Imaging 2007, 2007, San Jose, CA, United States
Abstract
When TOF laser scanners were introduced on the market, their performances were rather poor, having in general a measurement uncertainty in the range of centimeters. For this reason it was clear that their application was definitely limited to environment and architecture survey, where the large size of the involved objects makes acceptable the relative measurement error. But with the progressive improvement of technology, and the consequent increase in the measurement precision, the potential range of purposes have been widened. In this paper an application to museum objects have been considered. Studying the scanner performance when working at a low range, and using such results to properly interpret the acquired data, it was possible to survey a famous wooden model of S. Peter basilica in Rome, remodeling its shape with a 3D surface modeler. Resolution, precision and accuracy have been studied at distances ranging from 1 to 3 meters, in working conditions similar to those imposed by the museum constrains. The results were used to properly set-up some post processing steps instrumental characterization as a key step in the 3D modeling process, both for increasing the geometrical data reliability, and for processing them (e.g. in the smoothing phase) in a way compliant with their metrological characteristics.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gabriele Guidi and Carlo Bianchini "TOF laser scanner characterization for low-range applications", Proc. SPIE 6491, Videometrics IX, 649109 (29 January 2007); https://doi.org/10.1117/12.705288
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Cited by 14 scholarly publications.
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KEYWORDS
Laser scanners

3D modeling

Data modeling

Clouds

3D scanning

Error analysis

Distance measurement

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