New results from performance studies of Frisch-grid CdZnTe detectors

Aleksey E. Bolotnikov; Giuseppe S. Camarda; Gabriella A. Carini; Gomez W. Wright; Douglas Scott McGregor; Walter McNeil; Ralph B. James

doi:10.1117/12.563393

21 October 2004 New results from performance studies of Frisch-grid CdZnTe detectors

Aleksey E. Bolotnikov, Giuseppe S. Camarda, Gabriella A. Carini, Gomez W. Wright, Douglas Scott McGregor, Walter McNeil, Ralph B. James

Author Affiliations +

Proceedings Volume 5540, Hard X-Ray and Gamma-Ray Detector Physics VI; (2004) https://doi.org/10.1117/12.563393
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

New data regarding performance studies of Frish-grid CdZnTe (CZT) detectors are presented. The Frisch-grid detector configuration under investigation is a bar shaped CZT crystal with teh side surfaces coated with an insulating layer. A Frisch grid is fashioned by inserting the CZT bar into a metallic sleeve, or by depositing the metal directly upon the insulator; hence the semiconductor material does not come in contact with the metal grid. The simple design operates well as a single-carrier-sensitive device. Despite the simplicity of this device, its performance depends on the balanced combinations of several factors, including the bulk and surface conductivity, μτ product, and geometrical aspect ratio. Described are several effects that determine charge collection in such drift devices and, consequently, the performance of the non-contacting Frisch-grid configuration.

Citation Download Citation

Aleksey E. Bolotnikov, Giuseppe S. Camarda, Gabriella A. Carini, Gomez W. Wright, Douglas Scott McGregor, Walter McNeil, and Ralph B. James "New results from performance studies of Frisch-grid CdZnTe detectors", Proc. SPIE 5540, Hard X-Ray and Gamma-Ray Detector Physics VI, (21 October 2004); https://doi.org/10.1117/12.563393

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