Paper
25 May 2004 Measurement of non-Gaussian shot noise: influence of the environment
Bertrand Marie Reulet, Lafe Spietz, Christopher Mogan Wilson, Julien Senzier, Daniel Ethan Prober
Author Affiliations +
Proceedings Volume 5469, Fluctuations and Noise in Materials; (2004) https://doi.org/10.1117/12.543529
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain
Abstract
We present the first measurements of the third moment of the voltage fluctuations in a conductor. This technique can provide new and complementary information on the electronic transport in conducting systems. The measurement was performed on non-superconducting tunnel junctions as a function of voltage bias, for various temperatures and bandwidths up to 1GHz. The data demonstrate the significant effect of the electromagnetic environment of the sample.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bertrand Marie Reulet, Lafe Spietz, Christopher Mogan Wilson, Julien Senzier, and Daniel Ethan Prober "Measurement of non-Gaussian shot noise: influence of the environment", Proc. SPIE 5469, Fluctuations and Noise in Materials, (25 May 2004); https://doi.org/10.1117/12.543529
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Cited by 2 scholarly publications.
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KEYWORDS
Amplifiers

Resistance

Signal to noise ratio

Environmental sensing

Optical correlators

Calibration

Electromagnetism

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