Paper
27 August 2003 Design from chaos: applying data entropy methods for complex system design
Kevin Tiernan, Sven Riedel, Norman Douglas McMillan, David Kennedy, Andreas T. Augousti, Julian Mason, G. Doyle
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Abstract
The paper critically assesses and illustrates the use of the data entropy budget method in both product and systems engineering based on the experience of developing an optoelectronic instrument known as the tensiograph. The design of such a system involving optoelectronic, electronic, thermal, mechanical, chemical and data processing noise components presents difficult engineering problem from the complex of noise spectrum contributions. This project provides perhaps an important case study for optical engineers because it was developed over a period of 15 years. The design history recorded in the data entropy-time graph, shows clearly the step-wise improvements achieved from the various engineering efforts. The present 11-bits information content of the instrument, with impressive signal-to-noise ratio exceeding 1000:1, was developed from prototype with less than 3-bit resolution. The paper concludes with an assessment of the relevance of this method to optical engineering in which a diverse number of technologies are frequently integrated in products and systems. Finally, the role of data entropy methods in third level education is then briefly considered with very clear lessons drawn from the foregoing concrete example offered by this case study.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kevin Tiernan, Sven Riedel, Norman Douglas McMillan, David Kennedy, Andreas T. Augousti, Julian Mason, and G. Doyle "Design from chaos: applying data entropy methods for complex system design", Proc. SPIE 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications, (27 August 2003); https://doi.org/10.1117/12.468519
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Cited by 1 scholarly publication.
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KEYWORDS
Interference (communication)

Optoelectronics

Photodiodes

Sensors

Systems engineering

Rutherfordium

Error analysis

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