Characterization of the reflectivity of various black materials

Jennifer L. Marshall; Patrick Williams; Jean-Philippe Rheault; Travis Prochaska; Richard D. Allen; D. L. DePoy

doi:10.1117/12.2056729

8 July 2014 Characterization of the reflectivity of various black materials

Jennifer L. Marshall, Patrick Williams, Jean-Philippe Rheault, Travis Prochaska, Richard D. Allen, D. L. DePoy

Proceedings Volume 9147, Ground-based and Airborne Instrumentation for Astronomy V; 91474F (2014) https://doi.org/10.1117/12.2056729
Event: SPIE Astronomical Telescopes + Instrumentation, 2014, Montréal, Quebec, Canada

Abstract

We present total and specular reflectance measurements of various materials that are commonly (and uncommonly) used to provide baffling and/or to minimize the effect of stray light in optical systems. More specifically, we investigate the advantage of using certain black surfaces and their role in suppressing stray light on detectors in optical systems. We measure the total reflectance of the samples over a broad wavelength range (250 < λ < 2500 nm) that is of interest to astronomical instruments in the ultraviolet, visible, and near-infrared regimes. Additionally, we use a helium-neon laser to measure the specular reflectance of the samples at various angles. Finally, we compare these two measurements and derive the specular fraction for each sample.

Citation Download Citation

Jennifer L. Marshall, Patrick Williams, Jean-Philippe Rheault, Travis Prochaska, Richard D. Allen, and D. L. DePoy "Characterization of the reflectivity of various black materials", Proc. SPIE 9147, Ground-based and Airborne Instrumentation for Astronomy V, 91474F (8 July 2014); https://doi.org/10.1117/12.2056729

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