Paper
21 August 2013 Using compressive measurement to obtain images at ultra low-light-level
Author Affiliations +
Proceedings Volume 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications; 89081O (2013) https://doi.org/10.1117/12.2034412
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
In this paper, a compressive imaging architecture is used for ultra low-light-level imaging. In such a system, features, instead of object pixels, are imaged onto a photocathode, and then magnified by an image intensifier. By doing so, system measurement SNR is increased significantly. Therefore, the new system can image objects at ultra low-ligh-level, while a conventional system has difficulty. PCA projection is used to collect feature measurements in this work. Linear Wiener operator and nonlinear method based on FoE model are used to reconstruct objects. Root mean square error (RMSE) is used to quantify system reconstruction quality.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jun Ke and Ping Wei "Using compressive measurement to obtain images at ultra low-light-level", Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89081O (21 August 2013); https://doi.org/10.1117/12.2034412
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Cited by 1 scholarly publication.
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KEYWORDS
Signal to noise ratio

Imaging systems

Principal component analysis

Compressive imaging

Low light level imaging

Digital micromirror devices

Image processing

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