Ripplocations in layered materials: Sublinear scaling and basal climb

James G. McHugh, Pavlos Mouratidis, and Kenny Jolley
Phys. Rev. B 103, 195436 – Published 24 May 2021
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Abstract

The ripplocation is a crystallographic defect which is unique to layered materials, combining nanoscale delamination with the crystallographic slip of a basal dislocation. Here, we have studied basal dislocations and ripplocations, in single and multiple van der Waals layers, using analytical and computational techniques. Expressions for the energetic and structural scaling factors of surface ripplocations are derived, which are in close correspondence to the physics of a classical carpet ruck. Our simulations demonstrate that the lowest-energy structure of dislocation pileups in layered materials is the ripplocation, while large dislocation pileups in bulk graphite demonstrate multilayer delamination, curvature, and voids. This can provide a concise explanation for the large volumetric expansion seen in irradiated graphite.

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  • Received 18 December 2020
  • Revised 24 March 2021
  • Accepted 10 May 2021

DOI:https://doi.org/10.1103/PhysRevB.103.195436

©2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

James G. McHugh*, Pavlos Mouratidis, and Kenny Jolley

  • Department of Chemistry, Loughborough University, Epinal Way, Loughborough LE11 3TU, United Kingdom

  • *j.g.mchugh@lboro.ac.uk

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Issue

Vol. 103, Iss. 19 — 15 May 2021

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