Complex Nonlinear Deformation of Nanometer Intergranular Glassy Films in $\ensuremath{\beta}\mathrm{\text{\ensuremath{-}}}{\mathrm{Si}}_{3}{\mathrm{N}}_{4}$

Complex Nonlinear Deformation of Nanometer Intergranular Glassy Films in $β − {Si}_{3} N_{4}$

Jun Chen, Lizhi Ouyang, Paul Rulis, Anil Misra, and W. Y. Ching

Phys. Rev. Lett. 95, 256103 – Published 16 December 2005

Abstract

The mechanical properties of a model of Y-doped intergranular glassy film in silicon nitride ceramics are studied by large-scale ab initio modeling. By linking directly to its electronic structure, it is shown that this microstructure has a complex nonlinear deformation under stress and Y doping significantly enhances the mechanical properties. The calculation of the electrostatic potential across the film supports the space charge model in ceramic microstructures.

Received 12 August 2005

DOI:https://doi.org/10.1103/PhysRevLett.95.256103

Authors & Affiliations

Jun Chen^1,2, Lizhi Ouyang¹, Paul Rulis¹, Anil Misra³, and W. Y. Ching^1,*

¹Department of Physics, University of Missouri–Kansas City, Kansas City, Missouri 64110, USA
²Institute of Applied Physics and Computational Mathematics, Beijing, China, 100088
³Department of Civil and Mechanical Engineering, School of Computing and Engineering, University of Missouri–Kansas City, Kansas City, Missouri 64110, USA

^*Electronic address: chingw@umkc.edu

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Vol. 95, Iss. 25 — 16 December 2005

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Physical Review Letters

Complex Nonlinear Deformation of Nanometer Intergranular Glassy Films in β−Si3N4

Jun Chen, Lizhi Ouyang, Paul Rulis, Anil Misra, and W. Y. Ching

Phys. Rev. Lett. 95, 256103 – Published 16 December 2005

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Complex Nonlinear Deformation of Nanometer Intergranular Glassy Films in $β − {Si}_{3} N_{4}$